Abstract: In some embodiments, an imaging system is provided. The imaging system comprises an image sensor, a light source, control circuitry, and function logic. The image sensor comprises a pixel array that includes a plurality of polarization pixel cells and a plurality of time-of-flight pixel cells. The light source is configured to emit light pulses to an object. The control circuitry is coupled to the light source and the pixel array, and is configured to synchronize a timing of the emission of the light pulses with sensing of photons reflected from the object by the plurality of time-of-flight pixel cells to generate depth information. The function logic is configured to determine a set of ambiguous surface normals using signals generated by the plurality of polarization pixel cells, and to disambiguate the set of ambiguous surface normals using the depth information to generate a three-dimensional shape image.

Abstract: A light-trapping image sensor includes a pixel array and a lens array. The pixel array is formed in and on a semiconductor substrate and including photosensitive pixels each including a reflective material forming a cavity around a portion of semiconductor material to at least partly trap light that has entered the cavity. The cavity has a ceiling at a light-receiving surface of the semiconductor substrate, and the ceiling forms an aperture for receiving the light into the cavity. The lens array is disposed on the pixel array. Each lens of the lens array is aligned to the aperture of a respective cavity to focus the light into the cavity through the aperture.

Abstract: CMOS image sensor with LED flickering reduction and low color cross-talk are disclosed. In one embodiment, an image sensor includes a plurality of pixels arranged in rows and columns of a pixel array that is disposed in a semiconductor substrate. Each pixel includes a plurality of large subpixels (LPDs) and at least one small subpixel (SPD). A plurality of color filters are disposed over individual subpixels. Each individual SPD is laterally adjacent to at least one other SPD.

Abstract: In some embodiments, an image sensor is provided. The image sensor comprises a plurality of photodiodes arranged as a photodiode array. The photodiodes of the photodiode array are arranged into a first quadrant, a second quadrant, a third quadrant, and a fourth quadrant. A first polarization filter and a first telecentric lens are aligned with the first quadrant. A second polarization filter and a second telecentric lens are aligned with the second quadrant. A third polarization filter and a third telecentric lens are aligned with the third quadrant. A fourth telecentric lens is aligned with the fourth quadrant.

Abstract: An optical system comprises an imaging lens for imaging an object to an image and a sensing pixel array for detecting lights from the object toward the image. The sensing pixel array comprises a first sensing pixel and a second sensing pixel, each sensing pixel comprising a microlens covering a one-dimensional series of photodiodes having n photodiodes. A photodiode at an end of the one-dimensional series of photodiodes of the first sensing pixel detects a first light from the object toward the image, and a photodiode at an opposite end of the one-dimensional series of photodiodes of the second sensing pixel detects a second light from the object toward the image, where the first light and the second light pass opposite parts of the imaging lens.

Abstract: A flare-blocking image sensor includes large pixels and small pixels, a microlens, and an opaque element. The large pixels and small pixels form a first and second pixel array respectively, each having a pixel pitch Px and Py. The second pixel array is offset from the first pixel array by ½Px and ½Py. A first large pixel of the large pixels is between and collinear with a first and a second small pixel separated by ?{square root over (Px2+Py2)} in a first direction and each having a width W less than both pixel pitch Px and Py. The microlens is aligned with the first large pixel. The opaque element is between the first large pixel and the microlens and extends, in the first direction, less than 1 2 ? ( P x 2 + P y 2 - W ) from the first small pixel toward the second small pixel. The opaque element has a width perpendicular to the first direction not exceeding width W.

Abstract: An image sensor with embedded wells for accommodating light emitters includes a semiconductor substrate including an array of doped sensing regions respectively corresponding to an array of photosensitive pixels of the image sensor. The semiconductor substrate forms an array of wells. Each well is aligned with a respective doped sensing region to facilitate detection, by the photosensitive pixel that includes said respective doped sensing region, of light emitted to the photosensitive pixel by a light emitter disposed in the well. The image sensor further includes, between adjacent doped sensing regions, a light-blocking barrier to reduce propagation of light to the doped sensing-region of each photosensitive pixel from wells not aligned therewith.

Abstract: A light sensor includes a photodiode, interlayer dielectric layer and plurality of metal layers. A polarizer is disposed in the plurality of metal layers. The photodiode is coupled to generate charge in response to incident light directed through a first side of the semiconductor layer. The polarizer includes a first metal grid formed with a first metal layer and a second metal grid formed with a third metal layer. The second metal grid is stacked with the first metal grid such that the first and second metal grids are disposed above and aligned with the photodiode. The photodiode is optically coupled to receive incident light through the first and second metal grids of the polarizer and through the first side of the semiconductor layer.

Abstract: CMOS image sensor with LED flickering reduction and low color cross-talk are disclosed. In one embodiment, an image sensor includes a plurality of pixels arranged in rows and columns of a pixel array that is disposed in a semiconductor substrate. Each pixel includes a plurality of large subpixels (LPDs) and at least one small subpixel (SPD). A plurality of color filters are disposed over individual subpixels. Each individual SPD is laterally adjacent to at least one other SPD.

Abstract: A liquid crystal on silicon device is described. The liquid crystal on silicon device includes a plurality of mirror electrodes, a transparent electrode, a liquid crystal material, and a plurality of microlenses. The plurality of mirror electrodes are arranged periodically to form an array of pixels, each pixel included in the array of pixels configurable to reflect incident light. The transparent electrode is optically aligned with the plurality of mirror electrodes. The liquid crystal material is disposed between the transparent electrode and the plurality of mirror electrodes. The plurality of microlenses are optically aligned with the plurality of mirror electrodes. Each microlens included in the plurality of microlenses is positioned to focus the incident light on a respective one of the plurality of mirror electrodes.

Abstract: A flare-blocking image sensor includes large pixels and small pixels, a microlens, and an opaque element. The large pixels and small pixels form a first and second pixel array respectively, each having a pixel pitch Px and Py. The second pixel array is offset from the first pixel array by ½Px and ½Py. A first large pixel of the large pixels is between and collinear with a first and a second small pixel separated by ?{square root over (Px2+Py2 )} in a first direction and each having a width W less than both pixel pitch Px and Py. The microlens is aligned with the first large pixel. The opaque element is between the first large pixel and the microlens and extends, in the first direction, less than ½(?{square root over (Px2+Py2)}?W) from the first small pixel toward the second small pixel. The opaque element has a width perpendicular to the first direction not exceeding width W.

Abstract: In some embodiments, an image sensor is provided. The image sensor comprises a plurality of photodiodes arranged as a photodiode array. The photodiodes of the photodiode array are arranged into a first quadrant, a second quadrant, a third quadrant, and a fourth quadrant. A first polarization filter and a first telecentric lens are aligned with the first quadrant. A second polarization filter and a second telecentric lens are aligned with the second quadrant. A third polarization filter and a third telecentric lens are aligned with the third quadrant. A fourth telecentric lens is aligned with the fourth quadrant.

Abstract: A flare-suppressing image sensor includes a first pixel formed in a substrate and a refractive element located above the first pixel. The refractive element has, with respect to a top surface of the substrate, a height profile having at least two one-dimensional local maxima in each of a first cross-sectional plane and a second cross-sectional plane perpendicular to the first cross-sectional plane. Each of the first and second cross-sectional planes is perpendicular to the top surface and intersects the first pixel.

Abstract: An image sensor with quantum efficiency enhanced by inverted pyramids includes a semiconductor substrate and a plurality of microlenses. The semiconductor substrate includes an array of pixels. Each of the pixels is configured to convert light incident on the pixel to an electrical output signal, the semiconductor substrate having a top surface for receiving the light. The top surface forms a plurality of inverted pyramids in each pixel. The plurality of microlenses are disposed above the top surface and aligned to the plurality of inverted pyramids, respectively.

Abstract: Image sensors include a substrate material having a plurality of small photodiodes (SPDs) and a plurality of large photodiodes (LPDs) disposed therein. A plurality of pixel isolators is formed in the substrate material, each pixel isolator being disposed between one of the SPDs and one of the LPDs. A passivation layer is disposed on the substrate material and a buffer layer is disposed on the passivation layer. A plurality of first metal elements is disposed in the buffer layer, each first metal element being disposed over one of the pixel isolators, and a plurality of second metal elements is disposed over the plurality of first metal elements.

Abstract: An image sensor includes a substrate material, an array of the color filters, an array of waveguides and spacers. The substrate material includes a plurality of photodiodes disposed therein. The array of color filters are disposed over the substrate material. The array of waveguides are disposed over the substrate material. The buffer layer is disposed between the substrate material and the arrays of color filters and waveguides. The spacers are disposed between the color filters in the array of color filters. The spacers are disposed between the waveguides in the array of waveguides. Incident light is adapted to be confined between the spacers. The incident light is adapted to be directed through one of the waveguides and through one of the color filters prior to being directed through the buffer layer into one of the photodiodes in the substrate material.

Abstract: In some embodiments, an image sensor is provided. The image sensor comprises a plurality of photodiodes arranged as a photodiode array. The plurality of photodiodes includes a first set of photodiodes configured as phase detection photodiodes, and a second set of photodiodes configured as polarization detection photodiodes. In some embodiments, a controller is provided. The controller comprises circuitry configured to process signals from a first set of photodiodes of a photodiode array to obtain depth information; process signals from a second set of photodiodes of the photodiode array to obtain polarization information; process the polarization information to obtain an ambiguous set of surface normals; and process the ambiguous set of surface normals using the depth information to obtain a three-dimensional shape image.

Abstract: A system comprising a polarization CMOS image sensor, at least one processor and a non-transitory computer-readable medium having computer-executable instructions stored thereon that, in response to execution by the at least one processor, cause the system to perform actions including receiving, from the polarization CMOS image sensor, polarization information and two-dimensional image information. The polarization information is processed using a machine learning model to generate an output that indicates whether the polarization information represents a valid biometric measurement of a physical feature of a subject.

Abstract: An image sensor includes a substrate material. The substrate material includes a plurality of photodiodes disposed therein. The plurality of photodiodes includes a plurality of small photodiodes (SPDs) and a plurality of large photodiodes (LPDs) larger than the SPDs. An array of color filters is disposed over the substrate material. A buffer layer is disposed between the substrate material and the array of color filters. A metal pattern is disposed between the color filters in the array of color filters, and between the array of color filters and the buffer layer. An attenuation layer is disposed between the substrate material and the array of color filters. The attenuation layer is above and aligned with the plurality of SPDs and a portion of each of the plurality of LPDs. An edge of the attenuation layer is over one of the plurality of LPDs.

Abstract: In some embodiments, an imaging system is provided. The imaging system comprises an image sensor, a light source, control circuitry, and function logic. The image sensor comprises a pixel array that includes a plurality of polarization pixel cells and a plurality of time-of-flight pixel cells. The light source is configured to emit light pulses to an object. The control circuitry is coupled to the light source and the pixel array, and is configured to synchronize a timing of the emission of the light pulses with sensing of photons reflected from the object by the plurality of time-of-flight pixel cells to generate depth information. The function logic is configured to determine a set of ambiguous surface normals using signals generated by the plurality of polarization pixel cells, and to disambiguate the set of ambiguous surface normals using the depth information to generate a three-dimensional shape image.