Patents by Inventor Alistair Nicholas Sporck

Alistair Nicholas Sporck has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for testing devices using serially controlled intelligent switches
    Patent number: 8872534
    Abstract: Methods and apparatus for testing devices using serially controlled intelligent switches have been described. In some embodiments, a probe card assembly can be provided that includes a plurality of integrated circuits (ICs) serially coupled to form a chain, the chain coupled to at least one serial control line, the plurality of ICs including switches coupled to test probes, each of the switches being programmable responsive to a control signal on the at least one serial control line.
    Type: Grant
    Filed: July 8, 2011
    Date of Patent: October 28, 2014
    Assignee: FormFactor, Inc.
    Inventors: Tommie Edward Berry, Alistair Nicholas Sporck
  • Wafer level contactor
    Patent number: 8400176
    Abstract: A probe card assembly can include a plurality of probes disposed on a substrate and arranged to contact terminals of a semiconductor wafer. Switches can be disposed on the probe card assembly and provide for selective connection and disconnection of the probes from electrical interconnections on the probe card assembly.
    Type: Grant
    Filed: August 18, 2009
    Date of Patent: March 19, 2013
    Assignee: FormFactor, Inc.
    Inventors: Brian J. Arkin, Alistair Nicholas Sporck
  • Method and apparatus for testing devices using serially controlled intelligent switches
    Patent number: 7977959
    Abstract: Methods and apparatus for testing devices using serially controlled intelligent switches have been described. In some embodiments, a probe card assembly can be provided that includes a plurality of integrated circuits (ICs) serially coupled to form a chain, the chain coupled to at least one serial control line, the plurality of ICs including switches coupled to test probes, each of the switches being programmable responsive to a control signal on the at least one serial control line.
    Type: Grant
    Filed: September 27, 2007
    Date of Patent: July 12, 2011
    Assignee: FormFactor, Inc.
    Inventors: Tommie Edward Berry, Alistair Nicholas Sporck
  • WAFER LEVEL CONTACTOR
    Publication number: 20110043233
    Abstract: A probe card assembly can include a plurality of probes disposed on a substrate and arranged to contact terminals of a semiconductor wafer. Switches can be disposed on the probe card assembly and provide for selective connection and disconnection of the probes from electrical interconnections on the probe card assembly.
    Type: Application
    Filed: August 18, 2009
    Publication date: February 24, 2011
    Inventors: Brian Arkin, Alistair Nicholas Sporck
  • Probe card with coplanar daughter card
    Patent number: 7116119
    Abstract: A probe card assembly includes a printed circuit board with tester contacts for making electrical connections to a semiconductor tester. The probe card assembly also includes a probe head assembly with probes for contacting a semiconductor device under test. One or more daughter cards is mounted to the printed circuit board such that they are substantially coplanar with the printed circuit board. The daughter cards may contain a circuit for processing test data, including test signals to be input into the semiconductor and/or response signals generated by the semiconductor device in response to the test signals.
    Type: Grant
    Filed: February 15, 2005
    Date of Patent: October 3, 2006
    Assignee: FormFactor, Inc.
    Inventors: Alistair Nicholas Sporck, Makarand S. Shinde