Abstract: The present invention provides a monitor, especially a wake up monitor, for monitoring an integrated circuit, the monitor comprising a first monitoring unit configured to monitor at least one input of the integrated circuit, a second monitoring unit configured to monitor at least one output of the integrated circuit, a measurement unit configured to measure the time elapsed between an event on the at least one input and a reaction to the event on the at least one output and configured to output an alert signal if the elapsed time exceeds a predetermined first time limit. The present invention furthermore discloses an integrated circuit and a method for monitoring an integrated circuit.

Abstract: A data processing device, comprising a processing unit and a test control unit connected to the processing unit, is described. The processing unit and the test control unit are arranged to: start a logic test of the processing unit; detect a test abort event; and, in response to the test abort event, perform an event response action which comprises aborting the logic test and booting the processing unit, said booting including executing an event handling routine. The event response action may comprise setting a reset vector to an address of the event handling routine. System availability may thus be improved. In particular, the delay between capturing an asynchronous signal and responding to it may be reduced. The test abort event may, for example, be an asynchronous event having certain pre-defined characteristics. A method of operating a data processing device is also described.

Abstract: A data processing device, comprising a processing unit and a test control unit connected to the processing unit, is described. The processing unit and the test control unit are arranged to: start a logic test of the processing unit; detect a test abort event; and, in response to the test abort event, perform an event response action which comprises aborting the logic test and booting the processing unit, said booting including executing an event handling routine. The event response action may comprise setting a reset vector to an address of the event handling routine. System availability may thus be improved. In particular, the delay between capturing an asynchronous signal and responding to it may be reduced. The test abort event may, for example, be an asynchronous event having certain pre-defined characteristics. A method of operating a data processing device is also described.