Patents by Inventor Allan I. Dacanay

Allan I. Dacanay has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20110017806
    Abstract: A wire bond apparatus and method can include wire bonder head having a capillary there through and a bond wire within the capillary. A forming gas inlet to the capillary allows injection of forming gas directly into the wire bond head capillary. The forming gas can be forced from the end of the capillary to accurately envelop an end of the bond wire in forming gas during free-air ball formation, which can decrease oxidation of the free-air ball during formation, reduce a quantity of forming gas used, and result in a more symmetrical free-air ball and an improved bond wire attachment.
    Type: Application
    Filed: July 21, 2009
    Publication date: January 27, 2011
    Inventors: Jerry Gomez Cayabyab, Timer D. Porras, Allan I. Dacanay
  • Patent number: 7000822
    Abstract: An improved bond integrity test system is provided by eliminating the spring loaded wire spool cover which contributes to particulate matter, and by addition of a second contact diverter in the wire path. These improvements have been shown to decrease false lifted ball bond reports by 68%, and therefore to improve productivity and accuracy of the test system. Such changes are readily adapted to current bonders, as well as to new designs.
    Type: Grant
    Filed: September 15, 2004
    Date of Patent: February 21, 2006
    Assignee: Texas Instruments Incorporated
    Inventors: Allan I. Dacanay, Raymond M. Partosa, Enrique R. Ferrer
  • Patent number: 6808943
    Abstract: An improved bond integrity test system is provided by eliminating the spring loaded wire spool cover which contributes to particulate matter, and by addition of a second contact diverter in the wire path. These improvements have been shown to decrease false lifted ball bond reports by 68%, and therefore to improve productivity and accuracy of the test system. Such changes are readily adapted to current bonders, as well as to new designs.
    Type: Grant
    Filed: June 10, 2002
    Date of Patent: October 26, 2004
    Assignee: Texas Instruments Incorporated
    Inventors: Allan I. Dacanay, Raymond M. Partosa, Enrique R. Ferrer
  • Publication number: 20030227016
    Abstract: An improved bond integrity test system is provided by eliminating the spring loaded wire spool cover which contributes to particulate matter, and by addition of a second contact diverter in the wire path. These improvements have been shown to decrease false lifted ball bond reports by 68%, and therefore to improve productivity and accuracy of the test system. Such changes are readily adapted to current bonders, as well as to new designs.
    Type: Application
    Filed: June 10, 2002
    Publication date: December 11, 2003
    Inventors: Allan I. Dacanay, Raymond M. Partosa, Enrique R. Ferrer