Patents by Inventor Allen C. Keeney

Allen C. Keeney has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6977381
    Abstract: A gating grid for deflecting ions includes an insulating substrate (16), a conducting layer (28) adhered to the insulating substrate (16), and interdigitated electrodes (14) patterned in the conducting layer by a photolithographic process. A hole (18) in the insulating substrate beneath the interdigitated electrodes allows ions to pass through the hole in the substrate. A process for making a gating grid for deflecting ions includes adhering a conducting layer (28) to an insulating substrate (16), forming interdigitated electrodes (14) on the conducting layer (28), and then forming a hole (18) in the insulating substrate beneath the interdigitated electrodes.
    Type: Grant
    Filed: January 29, 2003
    Date of Patent: December 20, 2005
    Assignee: The Johns Hopkins University
    Inventors: Harry K. Charles, Jr., Arthur S. Francomacaro, Allen C. Keeney, David M. Lee, Timothy J. Cornish
  • Publication number: 20040231150
    Abstract: A gating grid for deflecting ions includes an insulating substrate (16), a conducting layer (28) adhered to the insulating substrate (16), and interdigitated electrodes (14) patterned in the conducting layer by a photolithographic process. A hole (18) in the insulating substrate beneath the interdigitated electrodes allows ions to pass through the hole in the substrate. A process for making a gating grid for deflecting ions includes adhering a conducting layer (28) to an insulating substrate (16), forming interdigitated electrodes (14) on the conducting layer (28), and then forming a hole (18) in the insulating substrate beneath the interdigitated electrodes.
    Type: Application
    Filed: June 25, 2003
    Publication date: November 25, 2004
    Inventors: Harry K. Charles, Arthur S Francomacaro, Allen C Keeney, David M Lee, Timothy J Cornish