Patents by Inventor Allen Gu

Allen Gu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12056894
    Abstract: A method images a region of interest of a sample using a tomographic X-ray microscope. The method includes registering a position of the sample. Registering includes: imaging a portion of the sample containing a feature using the microscope, identifying the feature by matching the feature to a pre-recorded feature, and determining a relative position of the feature in relation to the pre-recorded feature. The method also includes navigating a field of view of the microscope over the region of interest based on the registered position of the sample, and imaging the region of interest using the microscope.
    Type: Grant
    Filed: September 9, 2021
    Date of Patent: August 6, 2024
    Assignee: Carl Zeiss SMT, Inc.
    Inventors: Thomas Anthony Case, Susan Candell, Naomi Kotwal, Allen Gu, Lorenz Lechner, Wayne Broderick
  • Patent number: 12007339
    Abstract: A sample holder for holding a sample during an X-ray imaging process includes a sample placement surface on which the sample is placed for positioning the sample in a depth direction of the sample holder. The sample holder also includes a first alignment portion for aligning the sample in a width direction of the sample holder, and a second alignment portion for aligning the sample in a height direction of the sample holder.
    Type: Grant
    Filed: September 9, 2021
    Date of Patent: June 11, 2024
    Assignee: Carl Zeiss SMT Inc.
    Inventors: Thomas Anthony Case, Susan Candell, Naomi Kotwal, Allen Gu, Zheren Wu, Wayne Broderick
  • Publication number: 20210407127
    Abstract: A method images a region of interest of a sample using a tomographic X-ray microscope. The method includes registering a position of the sample. Registering includes: imaging a portion of the sample containing a feature using the microscope, identifying the feature by matching the feature to a pre-recorded feature, and determining a relative position of the feature in relation to the pre-recorded feature. The method also includes navigating a field of view of the microscope over the region of interest based on the registered position of the sample, and imaging the region of interest using the microscope.
    Type: Application
    Filed: September 9, 2021
    Publication date: December 30, 2021
    Inventors: Thomas Anthony Case, Susan Candell, Naomi Kotwal, Allen Gu, Lorenz Lechner, Wayne Broderick
  • Publication number: 20210404977
    Abstract: A sample holder for holding a sample during an X-ray imaging process includes a sample placement surface on which the sample is placed for positioning the sample in a depth direction of the sample holder. The sample holder also includes a first alignment portion for aligning the sample in a width direction of the sample holder, and a second alignment portion for aligning the sample in a height direction of the sample holder.
    Type: Application
    Filed: September 9, 2021
    Publication date: December 30, 2021
    Inventors: Thomas Anthony Case, Susan Candell, Naomi Kotwal, Allen Gu, Zheren Wu, Wayne Broderick