Patents by Inventor Allen Jett

Allen Jett has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Parametric test system and method
    Patent number: 6008664
    Abstract: A system and method for reducing voltage stabilization time in a leakage current test system, and thereby reducing the time for measuring leakage currents in the I/O pins of an IC chip including CMOS DRAMs is disclosed. The method and system of the present invention accelerates leakage current testing time by precharging the capacitance of the I/O pins under test to a voltage near the settled voltage level, before measuring leakage current at the I/O pin contact points of packaged IC chips and assembled IC modules, and indicating when an I/O pin is defective.
    Type: Grant
    Filed: March 2, 1998
    Date of Patent: December 28, 1999
    Assignee: Tanisys Technology, Inc.
    Inventors: Allen Jett, Archer R. Lawrence