Abstract: Apparatus and methods for ultrasound probes are provided. In certain implementations, a receive switch for an ultrasound probe includes a first field effect transistor (FET) and a second FET electrically connected in series between a first terminal and a second terminal with the FETs' sources connected to one another. The receive switch includes a positive threshold detection and control circuit for turning off the receive switch when a voltage of the first terminal is greater than a positive threshold voltage, and a negative threshold detection and control circuit for turning off the receive switch when the first terminal's voltage is less than a negative threshold voltage. The receive switch further includes a gate bias circuit that can bias the gates of the first and second FETs so as to turn on the receive switch when no positive or negative high voltage conditions are detected on the first terminal.

Abstract: Apparatus and methods for ultrasound transmit switching are provided. In certain implementations, a transmit switch includes a bias polarity control circuit, a bias circuit, a first high voltage field effect transistor (HVFET), and a second HVFET. The sources of the first and second HVFETs are connected to one another at a source node, the gates of the first and second HVFETs are connected to one another at a gate node, and the drains of the first and second HVFETs are connected to an input terminal and an output terminal, respectively. The bias circuit and the bias polarity control circuit are each electrically connected between the source node and the gate node. The bias polarity control circuit can turn on or off the HVFETs by controlling a polarity of a bias voltage across the bias circuit, such as by controlling a direction of current flow through the bias circuit.

Abstract: Apparatus and methods for ultrasound transmit switching are provided. In certain implementations, a transmit switch includes a bias polarity control circuit, a bias circuit, a first high voltage field effect transistor (HVFET), and a second HVFET. The sources of the first and second HVFETs are connected to one another at a source node, the gates of the first and second HVFETs are connected to one another at a gate node, and the drains of the first and second HVFETs are connected to an input terminal and an output terminal, respectively. The bias circuit and the bias polarity control circuit are each electrically connected between the source node and the gate node. The bias polarity control circuit can turn on or off the HVFETs by controlling a polarity of a bias voltage across the bias circuit, such as by controlling a direction of current flow through the bias circuit.

Abstract: Apparatus and methods for ultrasound probes are provided. In certain implementations, a receive switch for an ultrasound probe includes a first field effect transistor (FET) and a second FET electrically connected in series between a first terminal and a second terminal with the FETs' sources connected to one another. The receive switch includes a positive threshold detection and control circuit for turning off the receive switch when a voltage of the first terminal is greater than a positive threshold voltage, and a negative threshold detection and control circuit for turning off the receive switch when the first terminal's voltage is less than a negative threshold voltage. The receive switch further includes a gate bias circuit that can bias the gates of the first and second FETs so as to turn on the receive switch when no positive or negative high voltage conditions are detected on the first terminal.

Abstract: A CMOS push-pull output buffer (171) is constructed utilizing a plurality of N channel transistors (74, 75, 76) and a plurality of P channel transistors (71, 72, 73) connected in series. The voltages applied to the gates of the N channel transistors and P channel transistors are selected to divide the high voltage (+V) substantially equally across the P channel transistors, when the P channel transistors are turned off, and substantially evenly divide the high voltage across the N channel transistors, when the N channel transistors are turned off.In another embodiment of this invention, selected ones of the N channel and P channel transistors are formed in order to have a high drain to bulk breakdown voltage.In another embodiment of this invention, a plurality of N channel and a plurality of P channel transistors are connected in series and driven by a single ended control voltage (C.sub.