Patents by Inventor Alli K S

Alli K S has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Dynamic quality metrics forecasting and management
    Patent number: 11587013
    Abstract: Systems and methods for dynamic quality metrics forecasting and management are provided. In embodiments, a method includes receiving, by a computing device, parameter data from one or more data sources for selected parameters, wherein the parameters are associated with one or more processes; generating, by the computing device, output values for plural quality metrics based on the parameter data; identifying, by the computing device, relationships between the plural quality metrics based on changes in the received parameter data and output values for the plural quality metrics over time; receiving, by the computing device, user-selected values for the selected parameters; and generating, by the computing device, predicted output values for the quality metrics based on the identified relationships between the quality metrics and the user-selected values.
    Type: Grant
    Filed: March 27, 2020
    Date of Patent: February 21, 2023
    Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Vinayak P Honrao, Alli K S, Shirshendu Saha
  • DYNAMIC QUALITY METRICS FORECASTING AND MANAGEMENT
    Publication number: 20210304105
    Abstract: Systems and methods for dynamic quality metrics forecasting and management are provided. In embodiments, a method includes receiving, by a computing device, parameter data from one or more data sources for selected parameters, wherein the parameters are associated with one or more processes; generating, by the computing device, output values for plural quality metrics based on the parameter data; identifying, by the computing device, relationships between the plural quality metrics based on changes in the received parameter data and output values for the plural quality metrics over time; receiving, by the computing device, user-selected values for the selected parameters; and generating, by the computing device, predicted output values for the quality metrics based on the identified relationships between the quality metrics and the user-selected values.
    Type: Application
    Filed: March 27, 2020
    Publication date: September 30, 2021
    Inventors: Vinayak P. Honrao, Alli K S, Shirshendu Saha