Patents by Inventor Alok Kanti Deb

Alok Kanti Deb has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • State estimation, diagnosis and control using equivalent time sampling
    Patent number: 8751097
    Abstract: A method and system for using Equivalent Time Sampling to improve the effective sampling rate of sensor data, and using the improved-resolution data for diagnosis and control. Data samples from existing sensors are provided, where the sampling rate of the existing sensors is not sufficient to accurately characterize the parameters being measured. High-resolution data sets are reconstructed using Equivalent Time Sampling. High-resolution input data sets are used in a system model to simulate the performance of the system being measured. Results from the system model, and high-resolution output data sets from Equivalent Time Sampling, are provided to an estimator, which provides accurate estimation of measured quantities and estimation of quantities not measured. Output from the estimator is used for fault diagnosis and control of the system being measured.
    Type: Grant
    Filed: May 10, 2011
    Date of Patent: June 10, 2014
    Assignees: GM Global Technology Operations LLC, Indian Institute of Technology Kharagpur
    Inventors: Soumen De, Pattada A. Kallappa, Pulak Bandyopadhyay, Siddhartha Mukhopadhyay, Somnath Sengupta, Alok Kanti Deb
  • STATE ESTIMATION, DIAGNOSIS AND CONTROL USING EQUIVALENT TIME SAMPLING
    Publication number: 20120290168
    Abstract: A method and system for using Equivalent Time Sampling to improve the effective sampling rate of sensor data, and using the improved-resolution data for diagnosis and control. Data samples from existing sensors are provided, where the sampling rate of the existing sensors is not sufficient to accurately characterize the parameters being measured. High-resolution data sets are reconstructed using Equivalent Time Sampling. High-resolution input data sets are used in a system model to simulate the performance of the system being measured. Results from the system model, and high-resolution output data sets from Equivalent Time Sampling, are provided to an estimator, which provides accurate estimation of measured quantities and estimation of quantities not measured. Output from the estimator is used for fault diagnosis and control of the system being measured.
    Type: Application
    Filed: May 10, 2011
    Publication date: November 15, 2012
    Applicants: INDIAN INSTITUTE OF TECHNOLOGY KHARAGPUR, GM GLOBAL TECHNOLOGY OPERATIONS LLC
    Inventors: Soumen De, Pattada A. Kallappa, Pulak Bandyopadhyay, Siddhartha Mukhopadhyay, Somnath Sengupta, Alok Kanti Deb