Patents by Inventor Alper Genc

Alper Genc has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and Apparatus for use in Improving Linearity of MOSFETs using an Accumulated Charge Sink-Harmonic Wrinkle Reduction
    Publication number: 20140312422
    Abstract: A method and apparatus for use in improving linearity sensitivity of MOSFET devices having an accumulated charge sink (ACS) are disclosed. The method and apparatus are adapted to address degradation in second- and third-order intermodulation harmonic distortion at a desired range of operating voltage in devices employing an accumulated charge sink.
    Type: Application
    Filed: March 5, 2014
    Publication date: October 23, 2014
    Applicant: PEREGRINE SEMICONDUCTOR CORPORATION
    Inventors: Christopher N. Brindle, Jie Deng, Alper Genc, Chieh-Kai Yang
  • Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink-harmonic wrinkle reduction
    Patent number: 8742502
    Abstract: A method and apparatus for use in improving linearity sensitivity of MOSFET devices having an accumulated charge sink (ACS) are disclosed. The method and apparatus are adapted to address degradation in second- and third-order intermodulation harmonic distortion at a desired range of operating voltage in devices employing an accumulated charge sink.
    Type: Grant
    Filed: October 19, 2011
    Date of Patent: June 3, 2014
    Assignee: Peregrine Semiconductor Corporation
    Inventors: Christopher N. Brindle, Jie Deng, Alper Genc, Chieh-Kai Yang
  • Method and Apparatus for use in Improving Linearity of MOSFETS using an Accumulated Charge Sink-Harmonic Wrinkle Reduction
    Publication number: 20120267719
    Abstract: A method and apparatus for use in improving linearity sensitivity of MOSFET devices having an accumulated charge sink (ACS) are disclosed. The method and apparatus are adapted to address degradation in second- and third-order intermodulation harmonic distortion at a desired range of operating voltage in devices employing an accumulated charge sink.
    Type: Application
    Filed: October 19, 2011
    Publication date: October 25, 2012
    Inventors: Christopher N. Brindle, Jie Deng, Alper Genc, Chieh-Kai Yang