Patents by Inventor Alvy V. Padiyil

Alvy V. Padiyil has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Test socket
    Patent number: 7663387
    Abstract: A support block has a first face, a second face opposed to the first face, and first and second through holes communicating between the first face and the second face, and is formed with resin material. The first face, the second face, and the first and second through holes are covered with an electrically conductive plated coating. First and second probes are electrically connected to terminals of a device to be tested provided on a side of the first face and to terminals connected to a testing apparatus provided on a side of the second face. The first probe is provided in the first through hole and is electrically connected to the plated coating on the first through hole, the second probe is provided in the second through hole and is electrically connected to the plated coating on the second through hole.
    Type: Grant
    Filed: September 27, 2007
    Date of Patent: February 16, 2010
    Assignee: Yokowo Co., Ltd.
    Inventors: Takuto Yoshida, Alvy V. Padiyil
  • Test socket
    Publication number: 20090085593
    Abstract: A support block has a first face, a second face opposed to the first face, and first and second through holes communicating between the first face and the second face, and is formed with resin material. The first face, the second face, and the first and second through holes are covered with an electrically conductive plated coating. First and second probes are electrically connected to terminals of a device to be tested provided on a side of the first face and to terminals connected to a testing apparatus provided on a side of the second face. The first probe is provided in the first through hole and is electrically connected to the plated coating on the first through hole, the second probe is provided in the second through hole and is electrically connected to the plated coating on the second through hole.
    Type: Application
    Filed: September 27, 2007
    Publication date: April 2, 2009
    Inventors: Takuto YOSHIDA, Alvy V. PADIYIL