Patents by Inventor Alyn R. Holt
Alyn R. Holt has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Publication number: 20140317453Abstract: A method and apparatus for docking an electronic test head with a peripheral, which positions devices for testing. Exact-constraint alignment features, also sometimes known as kinematic features, are incorporated to provide repeatable positioning of the test head in three degrees of freedom with respect to the docking plane of the peripheral. A distinct alignment feature is used to provide planarity and to establish the required docked distance between the test head and the peripheral. The exact-constraint alignment features are mounted compliantly to enable them to position the test head in the plane while the test head is away from its final docked distance and to maintain that position as the test head is moved to its final docked position.Type: ApplicationFiled: July 11, 2012Publication date: October 23, 2014Applicant: INTEST CORPORATIONInventors: Alyn R. Holt, Brian R. Moore
-
Patent number: 7554321Abstract: A positioner, such as a test head carrier for a semiconductor wafer and device tester, includes a vertical support and a main arm for supporting a test head. The main arm is suspended for vernier movement by use of a counterbalancing force such as counterweights. The suspension of the main arm is performed at a mechanical advantage so that reduced counter-blancing force and correspondingly large movements on the counterblance side are used to effect the vernier movement. The vertical support may be adjusted with a non-compliant drive such as a ball screw mechanism. The vernier movement can also be used to sense collisions and other positioning errors and actuation of the drive for the vertical support can be controlled accordingly.Type: GrantFiled: March 1, 2001Date of Patent: June 30, 2009Assignee: inTEST CorporationInventors: Alyn R. Holt, Brian R. Moore, Henri M. Akouka
-
Patent number: 7466122Abstract: A system for docking an electronic test head with a handling apparatus is provided. The system includes an assembly for at least partially aligning and subsequently bringing together the electronic test head and the handling apparatus. The system also includes a power driven actuator for providing only partially powered assistance in bringing together the electronic test head and the handling apparatus.Type: GrantFiled: August 11, 2006Date of Patent: December 16, 2008Assignee: inTEST IP CorporationInventors: Naum Gudin, Christopher L. West, I. Marvin Weilerstein, Nils. O. Ny, Alyn R. Holt
-
Patent number: 7340972Abstract: A load, such as an electronic test head, is supported. A force sensor detects a force received from the load, the force resulting from the load being imbalanced such that a torque is created about a rotational axis of the load. A source of force provides a counter force relative to the load in response to the force detected by the force sensor. A method of docking an electronic test head held in a test head manipulator to an electronic device handler is also provided. The method of docking includes measuring a magnitude of an imbalance force along or about at least one of a plurality of motion axes of the test head manipulator; and providing a counter force to the imbalance force.Type: GrantFiled: March 15, 2006Date of Patent: March 11, 2008Assignee: inTEST CorporationInventors: Nil O. Ny, Henri M. Akouka, Alyn R. Holt
-
Patent number: 7245118Abstract: A system is useful for positioning a load, such as a test head. The system includes an arm which supports the load and which moves along a first vertical axis. The system also includes a rotation unit for rotating the first vertical axis about a second vertical axis spaced apart from the first vertical axis.Type: GrantFiled: September 30, 2004Date of Patent: July 17, 2007Assignee: inTest CorporationInventors: Alyn R. Holt, Richard C. Powell, Jr., I. Marvin Weilerstein
-
Patent number: 7109733Abstract: A system for docking an electronic test head with a handling apparatus is provided. The system includes an assembly for at least partially aligning and subsequently bringing together the electronic test head and the handling apparatus. The system also includes a power driven actuator for providing only partially powered assistance in bringing together the electronic test head and the handling apparatus.Type: GrantFiled: July 12, 2002Date of Patent: September 19, 2006Assignee: inTEST CorporationInventors: Naum Gudin, Christopher L. West, I. Marvin Weilerstein, Nils O. Ny, Alyn R. Holt
-
Patent number: 7084358Abstract: A load, such as an electronic test head, is supported. A force sensor detects a force received from the load, the force resulting from the load being imbalanced such that a torque is created about a rotational axis of the load. A source of force provides a counter force relative to the load in response to the force detected by the force sensor. A method of docking an electronic test head held in a test head manipulator to an electronic device handler is also provided. The method of docking includes measuring a magnitude of an imbalance force along or about at least one of a plruality of motion axes of the test head manipulator; and providing a counter force to the imbalance force.Type: GrantFiled: September 20, 2001Date of Patent: August 1, 2006Assignee: inTEST CorporationInventors: Nil O. Ny, Henri M. Akouka, Alyn R. Holt
-
Patent number: 6911816Abstract: A safety lock system prevents unlocking of a balanced loaded unit when the loaded unit becomes unbalanced. A plurality of calipers applies pressure on opposite sides of a guide rail. A lock block couples the load to at least one of the calipers for movement of the load along the guide rail. A rotatable handle is coupled to the calipers through a shaft. Rotation of the handle locks or unlocks the lock block against vertical movement. A safety block is coupled to the loaded unit and is moveable with the loaded unit for preventing rotation of the handle upon a preselected movement of the loaded unit relative to the lock block.Type: GrantFiled: September 30, 2004Date of Patent: June 28, 2005Assignee: inTEST IP CorporationInventors: Alyn R. Holt, Christopher L. West, Brian R. Moore, Richard C. Powell, Jr., I. Marvin Weilerstein
-
Patent number: 6888343Abstract: A system is useful for positioning a load, such as a test head. The system includes an arm which supports the load and which moves along a first vertical axis. The system also includes a rotation unit for rotating the first vertical axis about a second vertical axis spaced apart from the first vertical axis.Type: GrantFiled: January 12, 2000Date of Patent: May 3, 2005Assignee: inTEST IP CorporationInventors: Alyn R. Holt, Christopher L. West, Brian R. Moore, Richard C. Powell, Jr.
-
Publication number: 20040239353Abstract: A system for docking an electronic test head with a handling apparatus is provided. The system includes an assembly for at least partially aligning and subsequently bringing together the electronic test head and the handling apparatus. The system also includes a power driven actuator for providing only partially powered assistance in bringing together the electronic test head and the handling apparatus.Type: ApplicationFiled: July 7, 2004Publication date: December 2, 2004Inventors: Naum Gudin, Christopher L. West, I. Marvin Weilerstein, Nils O. Ny, Alyn R. Holt
-
Publication number: 20040051517Abstract: A positioner, such as a test head carrier for a semiconductor wafer and device tester, includes a vertical support and a main arm for supporting a test head. The main arm is suspended for vernier movement by use of a counterbalancing force such as counterweights. The suspension of the main arm is performed at a mechanical advantage so that reduced counter-blancing force and correspondingly large movements on the counterblance side are used to effect the vernier movement. The vertical support may be adjusted with a non-compliant drive such as a ball screw mechanism. The vernier movement can also be used to sense collisions and other positioning errors and actuation of the drive for the vertical support can be controlled accordingly.Type: ApplicationFiled: October 8, 2002Publication date: March 18, 2004Inventors: Alyn R. Holt, Brian R. Moore, Henri M. Akouka
-
Patent number: 6448797Abstract: A positioner facilitates docking and undocking of an electronic test head with a device handler. The positioner provides for rotation of the test head about a first axis. The positioner includes a support structure for moving the test head along a second axis orthogonal to the first axis. The support structure accurately docks the electronic test head with the device handler.Type: GrantFiled: April 28, 2000Date of Patent: September 10, 2002Assignee: inTest IP Corp.Inventors: Alyn R. Holt, Daniel J. Graham, I. Marvin Weilerstein, Christopher L. West
-
Patent number: 6057695Abstract: A positioner facilitates docking and undocking of an electronic test head with a device handler. The positioner provides for rotation of the test head about a first axis. The positioner includes a support structure for moving the test head along a second axis orthogonal to the first axis. The support structure accurately docks the electronic test head with the device handler.Type: GrantFiled: March 31, 1997Date of Patent: May 2, 2000Assignee: inTEST CorporationInventors: Alyn R. Holt, Daniel J. Graham, I. Marvin Weilerstein, Christopher L. West
-
Patent number: 5900737Abstract: A positioner facilitates docking and undocking of an electronic test head with a device handler. The positioner provides for rotation of the test head about a first axis. The positioner includes a linkage arm structure for moving the test head along a second axis orthogonal to the first axis. Using motors, sensors and a processor, the linkage arm structure accurately docks the electronic test head with the device handler.Type: GrantFiled: May 7, 1996Date of Patent: May 4, 1999Assignee: inTEST CorporationInventors: Daniel J. Graham, Alyn R. Holt, Robert E. Matthiessen, I. Marvin Weilerstein, Christopher L. West
-
Patent number: 5608334Abstract: A device testing system of the type in which an electronic test head is mounted for pivotal movement about three orthogonal axes. Cables are connected between a test cabinet and the test head to carry electronic signals. The test head is directly mounted to, and the cable is introduced to the test head through, a single piece cable pivot. The single piece cable pivot is attached to its housing by a method of installation which includes attaching cam followers to the housing through an opening included in the ring.Type: GrantFiled: April 20, 1995Date of Patent: March 4, 1997Assignee: InTest CorporationInventor: Alyn R. Holt
-
Patent number: 5600258Abstract: A positioner facilitates docking and undocking of an electronic test head with a device handler. The positioner provides for rotation of the test head about a first axis. The positioner includes a linkage arm structure for moving the test head along a second axis orthogonal to the first axis. Using motors, sensors and a processor, the linkage arm structure accurately docks the electronic test head with the device handler.Type: GrantFiled: December 12, 1994Date of Patent: February 4, 1997Assignee: inTEST CorporationInventors: Daniel J. Graham, Alyn R. Holt, Robert E. Matthiessen, I. Marvin Weilerstein, Christopher L. West
-
Patent number: 5450766Abstract: A system is disclosed for positioning an electronic test head with respect to an electronic device handler. The positioner assembly includes separate locks which allow the test head to move vertically while preventing rotation of the test head about the main shaft. Thus, the test head can be aligned with the device handler, moved vertically away from the device handler while adjustments are made, and easily realigned with the device handler after adjustments have been completed. Alternatively, the separate locks allow the test head to rotate about the main shaft while preventing movement along the main shaft. Thus, the test head can be aligned with the device handler, rotated about the main shaft and away from the device handler while adjustments are made, and easily realigned with the device handler after adjustments have been completed.Type: GrantFiled: August 29, 1994Date of Patent: September 19, 1995Assignee: Intest CorporationInventor: Alyn R. Holt
-
Patent number: 5440943Abstract: A positioner facilitates docking and undocking of an electronic test head with a device handler. The position provides for rotation of the test head about a first axis.Type: GrantFiled: September 15, 1993Date of Patent: August 15, 1995Assignee: inTEST CorporationInventors: Alyn R. Holt, Robert E. Matthiessen, Christopher L. West
-
Patent number: 5241870Abstract: A system is disclosed for positioning an electronic test head with respect to an electronic device handler. The positioner assembly includes separate locks which allow the test head to move vertically while preventing rotation of the test head about the main shaft. Thus, the test head can be aligned with the device handler, moved vertically away from the device handler while adjustments are made, and easily realigned with the device handler after adjustments have been completed. Alternatively, the separate locks allow the test head to rotate about the main shaft while preventing movement along the main shaft. Thus, the test head can be aligned with the device handler, rotated about the main shaft and away from the device handler while adjustments are made, and easily realigned with the device handler after adjustments have been completed.Type: GrantFiled: July 22, 1991Date of Patent: September 7, 1993Assignee: inTEST CorporationInventor: Alyn R. Holt
-
Patent number: 5030869Abstract: A device testing system of the type in which an electronic test head is mounted for pivotal movement about three orthogonal axes. Cables are connected between a test cabinet and the test head to carry electronic signals. The test head is directly mounted to, and the cable is introduced to the test head through, a split ring cable pivot.Type: GrantFiled: July 25, 1990Date of Patent: July 9, 1991Assignee: inTEST CorporationInventors: Alyn R. Holt, Robert E. Matthiessen