Abstract: Switching cells and decoupling capacitors in an integrated circuit design may be assessed to ensure voltage stability during high-speed switching events. Assessment of the switching cells and decoupling capacitors may include identifying the locations of the switching cells and the decoupling capacitors and dividing the integrated circuit design into a number of equally sized bins. Selected bins for each switching cell may be identified. The selected bin for each switching cell may be assessed, along with one or more bins neighboring the selected bin, to determine if a sufficient number of decoupling capacitors are available in these bins to provide voltage stability for each switching cell in the integrated circuit design.

Abstract: Switching cells and decoupling capacitors in an integrated circuit design may be assessed to ensure voltage stability during high-speed switching events. Assessment of the switching cells and decoupling capacitors may include identifying the locations of the switching cells and the decoupling capacitors and dividing the integrated circuit design into a number of equally sized bins. Selected bins for each switching cell may be identified. The selected bin for each switching cell may be assessed, along with one or more bins neighboring the selected bin, to determine if a sufficient number of decoupling capacitors are available in these bins to provide voltage stability for each switching cell in the integrated circuit design.