Patents by Inventor Amaia MUTUBERRIA LARRAYOZ

Amaia MUTUBERRIA LARRAYOZ has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11953236
    Abstract: A characterization device, system, and method for characterizing reflective elements from the light beams reflected in it. The device has two variable-gain detectors on a common structure, which can be portable or fixed, and for capturing light beams reflected by a reflective element, and from at least one processor characterizing the quality of the reflected light beams and evaluating the quality of the reflective element from its reflective capacity. Each detector has a lens for increasing the signal-to-noise ratio of the reflected beam or beams, a light sensor on which the beam or beams captured by the lens are focused, an automatic gain selection system associated with the optical sensor, and a data communication device associated with the device itself. A characterization system and a characterization method for characterizing reflective elements from the quality of the light beams reflected in at least one reflective element or heliostat.
    Type: Grant
    Filed: July 25, 2019
    Date of Patent: April 9, 2024
    Assignee: FUNDACIÓN CENER-CIEMAT
    Inventors: Iñigo Les Aguerrea, Amaia Mutuberria Larrayoz, Adrian Peña Lapuente, Marcelino Sanchez Gonzalez, Carlos Heras Vila, Iñigo Salina Áriz, David Izquierdo Núñez, Javier Garcia-Barberena Labiano
  • Publication number: 20210318033
    Abstract: A characterization device, system, and method for characterizing reflective elements from the light beams reflected in it. The device has two variable-gain detectors on a common structure, which can be portable or fixed, and for capturing light beams reflected by a reflective element, and from at least one processor characterizing the quality of the reflected light beams and evaluating the quality of the reflective element from its reflective capacity. Each detector has a lens for increasing the signal-to-noise ratio of the reflected beam or beams, a light sensor on which the beam or beams captured by the lens are focused, an automatic gain selection system associated with the optical sensor, and a data communication device associated with the device itself. A characterization system and a characterization method for characterizing reflective elements from the quality of the light beams reflected in at least one reflective element or heliostat.
    Type: Application
    Filed: July 25, 2019
    Publication date: October 14, 2021
    Applicant: FUNDACIÓN CENER-CIEMAT
    Inventors: Iñigo LES AGUERREA, Amaia MUTUBERRIA LARRAYOZ, Adrian PEÑA LAPUENTE, Marcelino SANCHEZ GONZALEZ, Carlos HERAS VILA, Iñigo SALINA ÁRIZ, David IZQUIERDO NÚÑEZ, Javier GARCIA-BARBERENA LABIANO