Patents by Inventor Amana Bokhari

Amana Bokhari has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7180602
    Abstract: An agile optical sensor based on spectrally agile heterodyne optical interferometric confocal microscopy implemented via an ultra-stable in-line acousto-optic tunable filter (AOTF) based interferometer using double anisotropic acousto-optic Bragg diffraction. One embodiment uses a tunable laser as the light source while other embodiments use a broadband source or a fixed wavelength laser as the source. One embodiment uses anisotropic diffractions in an AOTF to generate two near-collinear orthogonal linear polarization and slightly displaced beams that both pass via a test sample to deliver highly sensitive sample birefringence or material optical retardation measurements. A spherical lens is used to form focused spots for high resolution spatial sampling of the test object. The laser and AOTF tuning allows birefringence measurements taken at different wavelengths, one at a time.
    Type: Grant
    Filed: December 10, 2004
    Date of Patent: February 20, 2007
    Assignees: Nuonics, Inc., University of Central Florida
    Inventors: Nabeel Agha Riza, Frank Perez, Amana Bokhari
  • Publication number: 20050167578
    Abstract: An agile optical sensor based on spectrally agile heterodyne optical interferometric confocal microscopy implemented via an ultra-stable in-line acousto-optic tunable filter (AOTF) based interferometer using double anisotropic acousto-optic Bragg diffraction. One embodiment uses a tunable laser as the light source while other embodiments use a broadband source or a fixed wavelength laser as the source. One embodiment uses anisotropic diffractions in an AOTF to generate two near-collinear orthogonal linear polarization and slightly displaced beams that both pass via a test sample to deliver highly sensitive sample birefringence or material optical retardation measurements. A spherical lens is used to form focused spots for high resolution spatial sampling of the test object. The laser and AOTF tuning allows birefringence measurements taken at different wavelengths, one at a time.
    Type: Application
    Filed: December 10, 2004
    Publication date: August 4, 2005
    Inventors: Nabeel Riza, Frank Perez, Amana Bokhari