Abstract: An electronic circuit including a surface intended to be attached to another electronic circuit by hybrid molecular bonding. The electronic circuit includes an electrically-insulating layer exposed on the surface, and, distributed in the electrically-insulating layer, first electrically-conductive bonding pads exposed on a first portion of the surface, the density of the first bonding pads on the first portion of the surface being smaller than 30%, and at least one electrically-conductive test pad, exposed on a second portion of the surface containing a square having a side length greater than 30 ?m. The density of electrically-conductive material of the test pad exposed on the second portion of the surface is in the range from 40% to 80%.

Abstract: A method of treatment of an electronic circuit including at a location at least one electrically-conductive test pad having a first exposed surface. The method includes the at least partial etching of the test pad from the first surface, and the forming on the electronic circuit of an interconnection level covering said location and including, on the side opposite to said location, a second planar surface adapted for the performing of a hybrid molecular bonding.

Abstract: A semiconductor device comprises a substrate body with a surface, a conductor comprising a conductor material covering at least part of the surface, and a dielectric that is arranged on a part of the surface that is not covered by the conductor. Therein, the conductor is in contact with the substrate body, the conductor and the dielectric form a layer, and a bonding surface of the layer has surface topographies of less than 10 nm, with the bonding surface facing away from the substrate body. Moreover, the semiconductor device is free of a diffusion barrier.

Abstract: An electronic circuit including a surface intended to be attached to another electronic circuit by hybrid molecular bonding. The electronic circuit includes an electrically-insulating layer exposed on the surface, and, distributed in the electrically-insulating layer, first electrically-conductive bonding pads exposed on a first portion of the surface, the density of the first bonding pads on the first portion of the surface being smaller than 30%, and at least one electrically-conductive test pad, exposed on a second portion of the surface containing a square having a side length greater than 30 ?m. The density of electrically-conductive material of the test pad exposed on the second portion of the surface is in the range from 40% to 80%.

Abstract: A method of treatment of an electronic circuit including at a location at least one electrically-conductive test pad having a first exposed surface. The method includes the at least partial etching of the test pad from the first surface, and the forming on the electronic circuit of an interconnection level covering said location and including, on the side opposite to said location, a second planar surface adapted for the performing of a hybrid molecular bonding.

Abstract: The present disclosure relates to a method of manufacturing a first electronic circuit including a planar surface, intended to be affixed to a second electronic circuit by a self-assembly method with a hybrid molecular bonding, and first electrically-conductive pads exposed on the surface. The method includes the forming of a peripheral area around the surface including second exposed and raised pads, each at least partly having the same composition as the first pads.