Abstract: A heterogeneous multi-core integrated circuit includes first and second sets of processor cores and corresponding first and second test access ports (TAPs). The first and second TAPs are connected to corresponding first and second debug ports by way of corresponding first and second TAP controllers. A debug control circuit is connected between the first and second TAP controllers and the first and second debug ports. Based on external configuration signals, the debug control circuit configures the connections between the first and second TAP controllers and the first and second debug ports according to predetermined configuration modes, which allows flexibility in debugging the heterogeneous multi-core integrated circuit.

Abstract: A multi-core integrated circuit includes first and second sets of processor cores and corresponding first and second test access ports (TAPs). The first and second TAPs are connected to corresponding first and second debug ports by way of corresponding first and second TAP controllers. The first and second sets of processor cores include first and second memory blocks and corresponding first and second built-in-self-testing (BIST) engines of different architectures. A control circuit configures the first and second TAP controllers and the connection between the first and second sets of processor cores and the first and second debug ports, for initiating the first and second BIST engines for testing the memory blocks using a predetermined test mode. A debug access module provides secure access to the first and second debug ports.

Abstract: A heterogeneous multi-core integrated circuit includes first and second sets of processor cores and corresponding first and second test access ports (TAPs). The first and second TAPs are connected to corresponding first and second debug ports by way of corresponding first and second TAP controllers. A debug control circuit is connected between the first and second TAP controllers and the first and second debug ports. Based on external configuration signals, the debug control circuit configures the connections between the first and second TAP controllers and the first and second debug ports according to predetermined configuration modes, which allows flexibility in debugging the heterogeneous multi-core integrated circuit.

Abstract: A method for interfacing an out-of-order bus and multiple ordered buses and a bus bridge. The bus bridge includes multiple ordered bus interfaces, where each ordered bus interface is coupled to an ordered bus. A flow control logic circuit is coupled to the out-of-order bus and to the multiple ordered bus interfaces. The flow control logic circuit controls a flow of transaction requests between the out-of-order bus and each of the ordered buses interfaces. The flow control logic circuit includes an updating circuit for updating dependency resolution attributes and data readiness attributes associated with transaction requests, and a shared memory unit for storing the dependency resolution attributes, the data readiness attributes and the transaction requests where the transaction requests are destined to the ordered buses.

Abstract: A method for interfacing an out-of-order bus and multiple ordered buses and a bus bridge. The bus bridge includes multiple ordered bus interfaces, where each ordered bus interface is coupled to an ordered bus. A flow control logic circuit is coupled to the out-of-order bus and to the multiple ordered bus interfaces. The flow control logic circuit controls a flow of transaction requests between the out-of-order bus and each of the ordered buses interfaces. The flow control logic circuit includes an updating circuit for updating dependency resolution attributes and data readiness attributes associated with transaction requests, and a shared memory unit for storing the dependency resolution attributes, the data readiness attributes and the transaction requests where the transaction requests are destined to the ordered buses.