Abstract: Various embodiments may relate to an optoelectronic component device, including a first optically active structure, which is configured to provide an electromagnetic radiation, a measuring structure, which is configured to determine the luminance distribution of the electromagnetic radiation, wherein the measuring structure is configured to determine the luminance distribution in the first optically active structure, and wherein the measurement structure has a plurality of second optically active structures, wherein the plurality of second optically active structures are configured as optoelectric components and/or optoelectronic components, which receive the provided electromagnetic radiation.