Abstract: Systems and methods for transmitting a signal having a desired phase at the device are disclosed. The systems and methods further include determining a signal path length to a device over a transmission line and adding a delay to a signal to be transmitted over the transmission line. The determination is made in response to determining the path length to the device.

Abstract: A current mirror circuit that allows for over voltage stress testing includes: a first transistor; a second transistor having a gate coupled to a gate of the first transistor; a switch coupled between the gate of the first transistor and the drain of the first transistor; a bias source coupled to a control node of the switch such that the switch is ON during normal current mirror operation, and the switch is OFF during over voltage stress testing; and a clamp coupled between the control node of the switch and a source node.

Abstract: Systems and methods for transmitting a signal having a desired phase at the device are disclosed. The systems and methods further include determining a signal path length to a device over a transmission line and adding a delay to a signal to be transmitted over the transmission line. The determination is made in response to determining the path length to the device.

Abstract: A current mirror circuit that allows for over voltage stress testing includes: a first transistor; a second transistor having a gate coupled to a gate of the first transistor; a switch coupled between the gate of the first transistor and the drain of the first transistor; a bias source coupled to a control node of the switch such that the switch is ON during normal current mirror operation, and the switch is OFF during over voltage stress testing; and a clamp coupled between the control node of the switch and a source node.

Abstract: An operational amplifier having temperature-compensated offset correction. The amplifier includes an operational amplifier circuit, that has a first input field effect transistor (FET) having a gate connected to receive a first input signal, and a second input FET having a gate connected to receive a second input signal, the first and the second input FETs being connected together to receive a first bias current, and also being connected to respective sides of a first current mirror. A correction amplifier circuit is also provided, that has a first correction FET having a gate, and a second correction FET having a gate, the first and the second correction FETs being connected together to receive a second bias current, and also being connected to respective sides of a second current mirror.