Abstract: Method for modelling the noise injected into an electronic system. The invention relates to a method of modelling the noise injected into a mixed system (1) of digital and analogue, and/or radio-frequency type. In the invention, the injection of noise in the system (1) is modelled by macro-models of digital cells (8, 8.1-8.N) which model, in particular, noise related to the switching of the digital cells (C1-CN), and by models of lines (L1-LN) modelling, in particular, the noise resulting from a change of state of the signals transported over the lines.

Abstract: The invention concerns a method for testing immunity to noise derived from interferences between components in a mixed analogic and digital electronic system. The method comprises determining by simulating the highest-level noise observed in the system, or the worst noise generated by interferences. If a test for noise sensitivity is successful with this injected worst noise, then the system is accepted. In the case where the worst noise test fails, the method comprises calculating by simulating the lowest-level noise observed in the system, or the injected best noise. If a test for noise sensitivity fails with this injected best signal, then the system is rejected.