Patents by Inventor Amir A. Moshar

Amir A. Moshar has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus and method for scanning capacitance microscopy and spectroscopy
    Patent number: 7856665
    Abstract: An apparatus and technique for measuring the electrical capacitance between a conducting tip of a scanning probe microscope and a sample surface is described. A high frequency digital vector network analyzer is connected to the probe tip of the cantilever of an atomic force microscope, and data collection is coordinated by a digital computer using digital trigger signals between the AFM controller and the vector network analyzer. Methods for imaging tip-sample capacitance and spectroscopic measurements at a single point on the sample are described. A method for system calibration is described.
    Type: Grant
    Filed: November 15, 2007
    Date of Patent: December 21, 2010
    Assignee: Asylum Research Corporation
    Inventors: Maarten Rutgers, William H. Hertzog, Keith M. Jones, Amir A. Moshar
  • Apparatus and method for scanning capacitance microscopy and spectroscopy
    Publication number: 20090084952
    Abstract: An apparatus and technique for measuring the electrical capacitance between a conducting tip of a scanning probe microscope and a sample surface is described. A high frequency digital vector network analyzer is connected to the probe tip of the cantilever of an atomic force microscope, and data collection is coordinated by a digital computer using digital trigger signals between the AFM controller and the vector network analyzer. Methods for imaging tip-sample capacitance and spectroscopic measurements at a single point on the sample are described. A method for system calibration is described.
    Type: Application
    Filed: November 15, 2007
    Publication date: April 2, 2009
    Inventors: Maarten Rutgers, William H. Hertzog, Keith M. Jones, Amir A. Moshar