Abstract: There is provided a system and method of defect detection of a semiconductor specimen. The method includes obtaining a first image of the specimen acquired at a first bit depth, converting by a first processor the first image to a second image with a second bit depth lower than the first bit depth, transmitting the second image to a second processor configured to perform first defect detection on the second image using a first defect detection algorithm to obtain a first set of defect candidates, and sending locations of the first set of defect candidates to the first processor, extracting, from the first image, a set of image patches corresponding to the first set of defect candidates based on the locations, and performing second defect detection on the set of image patches using a second defect detection algorithm to obtain a second set of defect candidates.

Abstract: There is provided a method of training a machine learning model, comprising: for each set of sample medical images depicting calcification within a target anatomical structure wherein each set includes non-contrast medical image(s) and contrast enhanced medical image(s), correlating between calcifications depicted in the target anatomical structure of the contrast enhanced image(s) with corresponding calcifications depicted in the target anatomical structure of the non-contrast medical image(s), computing calcification parameter(s) for calcification depicted in the respective target anatomical structure, labelling each contrast enhanced medical image with the calcification parameter(s), and training the machine learning model on a training dataset that includes the contrast enhanced medical images of the sets, each labelled with ground truth label of a respective calcification parameter(s), for generating an outcome indicative of a target calcification parameter(s) for calcification depicted in the target ana

Abstract: A method of automatic optimization of an examination recipe includes obtaining inspection data of a given layer of a semiconductor specimen acquired by an inspection tool during runtime examination, the inspection data including inspection images representative of defect candidates from a defect map of the given layer, extracting inspection features characterizing the inspection images, and using a classifier to classify the defect candidates based on the inspection features, giving rise to a list of defect candidates having a higher probability of being defects of interest (DOIs).

Abstract: A system, method and computer readable medium for examining a specimen, the method comprising: obtaining defects of interest (DOIs) and false alarms (FAs) from a review subset selected from a group of potential defects received from an inspection tool, each potential defect is associated with attribute values defining a location of the potential defect in an attribute space; generating a representative subset of the group, comprising potential defects selected in accordance with a distribution of the potential defects within the attribute space, and indicating the potential defects in the representative subset as FA; and training a classifier using data informative of the attribute values of the DOIs, the potential defects of the representative subset, and respective indications thereof as DOIs or FAs, wherein the trained classifier is to be applied to at least some of the potential defects to obtain an estimation of a number of expected DOIs.

Abstract: There is provided a system and method of optimizing an inspection recipe for inspecting a semiconductor specimen. The method includes obtaining test data from a test performed after inspection, the test data indicative of functional defectivity of the specimen with respect to at least one structural feature at a suspected layer; retrieving inspection data of the suspected layer including a set of inspection images and a set of defect maps of the plurality of processing steps of the suspected layer; correlating the test data and the set of defect maps of the suspected layer to identify one or more structural features of the suspected layer with unmatched defectivity; for each of the identified structural features, including at least part of the inspection images corresponding to the structural feature in a training set; and using the training set to train a machine learning (ML) model in the inspection recipe.

Abstract: There is provided a system and method of defect detection of a semiconductor specimen. The method includes obtaining a first image of the specimen acquired at a first bit depth, converting by a first processor the first image to a second image with a second bit depth lower than the first bit depth, transmitting the second image to a second processor configured to perform first defect detection on the second image using a first defect detection algorithm to obtain a first set of defect candidates, and sending locations of the first set of defect candidates to the first processor, extracting, from the first image, a set of image patches corresponding to the first set of defect candidates based on the locations, and performing second defect detection on the set of image patches using a second defect detection algorithm to obtain a second set of defect candidates.

Abstract: There is provided a computer implemented method for identification of an indication of visual object(s) in anatomical image(s) of a target individual, comprising: providing anatomical image(s) of a body portion of a target individual, inputting the anatomical image(s) into a classification component of a neural network (NN) and into a segmentation component of the NN, feeding a size feature into the classification component of the NN, wherein the size feature comprises an indication of a respective size of each segmented visual object identified in the anatomical image(s), the size feature computed according to segmentation data outputted by the segmentation component for each pixel element of the anatomical image(s), and computing, by the classification component of the NN, an indication of visual object(s) in the anatomical image(s).

Abstract: A method of automatic optimization of an examination recipe includes obtaining inspection data of a given layer of a semiconductor specimen acquired by an inspection tool during runtime examination, the inspection data including inspection images representative of defect candidates from a defect map of the given layer, extracting inspection features characterizing the inspection images, and using a classifier to classify the defect candidates based on the inspection features, giving rise to a list of defect candidates having a higher probability of being defects of interest (DOIs).

Abstract: A processor receives data corresponding to a sensor, and generates a frame having a header and a payload. A data type value is selected from a set of multiple data type values corresponding to different respective types of data, the set of multiple data type values including at least i) a first data type value corresponding to video data from a camera, and ii) a second data type value corresponding to non-video data. The header is generated to include one or more fields set to the selected data type value to indicate a type of data included in the payload, and the payload is generated to include the data received from the sensor. The processor provides the frame to an Ethernet network interface. The Ethernet network interface encapsulates the frame in an Ethernet packet, and transmits the Ethernet packet via an Ethernet link.

Abstract: A sensor bridge, for use in an Ethernet network in a vehicle, includes a sensor interface, a mapper and a communication processor. The sensor interface is configured to receive sensor data from a sensor installed in the vehicle. The mapper is configured to form mapped sensor data by applying to the sensor data a direct mapping that maps specified parts of the sensor data to corresponding bit positions in one or more Ethernet packets. The communication processor is configured to generate the one or more Ethernet packets including the mapped sensor data, and to transmit the one or more Ethernet packets over the Ethernet network.

Abstract: An apparatus for controlling an imaging sensor in a vehicle includes an Ethernet transceiver, a sensor interface and a local processor. The Ethernet transceiver is configured to communicate over an in-vehicle Ethernet network with a remote processor. The sensor interface is configured to communicate with the imaging sensor. The local processor that is local to the apparatus and remotely located from the remote processor is configured to receive from the imaging sensor, via the sensor interface, image data and auxiliary data related to the image data, to send at least the image data to the remote processor via the Ethernet transceiver, to generate locally, based on the auxiliary data, and independently from the remote processor, control commands to control an operational aspect of the imaging sensor, and to send the control commands to the imaging sensor via the sensor interface.

Abstract: There is provided a method, comprising: accessing medical images of subjects, depicting contrast phases of contrast administered to the respective subject, accessing for a first subset of the medical images, metadata indicating a respective contrast phase, wherein a second subset of the medical images are unassociated with metadata, mapping each respective contrast phase of the contrast phases to a respective time interval indicating estimated amount of time from a start of contrast administration to time of capture of the respective medical image, creating a training dataset, by labelling images of the first subset with a label indicating the respective time interval, and including the second subset as non-labelled images, and training the ML model using the training dataset for generating an outcome of a target time interval indicating estimated amount of time from the start of contrast administration, in response to an input of a target medical image.

Abstract: There is provided a system and method of automatic optimization of an examination recipe. The method includes obtaining one or more inspection images each representative of at least a portion of the semiconductor specimen, the one or more inspection images being indicative of respective defect candidates selected from a defect map using a first classifier included in the examination recipe; obtaining label data respectively associated with the one or more inspection images and informative of types of the respective defect candidates; extracting inspection features characterizing the one or more inspection images; retraining the first classifier using the first features and the label data, giving rise to a second classifier; and optimizing the examination recipe by replacing the first classifier with the second classifier; wherein the optimized examination recipe is usable for examining a subsequent semiconductor specimen.

Abstract: There is provided a method, comprising: providing a training dataset including, medical images and corresponding text based reports, and concurrently training a natural language processing (NLP) machine learning (ML) model for generating a NLP category for a target text based report and a visual ML model for generating a visual finding for a target image, by: training the NLP ML model using the text based reports of the training dataset and a ground truth comprising the visual finding generated by the visual ML model in response to an input of the images corresponding to the text based reports of the training dataset, and training the visual ML model using the images of the training dataset and a ground truth comprising the NLP category generated by the NLP ML model in response to an input of the text based reports corresponding to the images of the training dataset.

Abstract: There is provided a method of training a machine learning model, comprising: for each set of sample medical images depicting calcification within a target anatomical structure wherein each set includes non-contrast medical image(s) and contrast enhanced medical image(s), correlating between calcifications depicted in the target anatomical structure of the contrast enhanced image(s) with corresponding calcifications depicted in the target anatomical structure of the non-contrast medical image(s), computing calcification parameter(s) for calcification depicted in the respective target anatomical structure, labelling each contrast enhanced medical image with the calcification parameter(s), and training the machine learning model on a training dataset that includes the contrast enhanced medical images of the sets, each labelled with ground truth label of a respective calcification parameter(s), for generating an outcome indicative of a target calcification parameter(s) for calcification depicted in the target ana

Abstract: Systems, methods, and computer-readable media for a well construction activity graph builder. An example method can include obtaining a stream of events associated with a wellbore; obtaining mapping metadata identifying data points to be included in a graph data model from a store of data associated with the wellbore; generating the graph data model based on the stream of events, the mapping metadata, and the data points identified in the mapping metadata, the graph data model including nodes representing logical entities associated with the data points, the nodes having interconnections based on data relationships defined in the mapping metadata, each logical entity corresponding to a set of data points from the data points; and generating a view of the graph data model, the view depicting at least some of the nodes and interconnections in the graph data model.

Abstract: There is provided a method, comprising: accessing medical images of subjects, depicting contrast phases of contrast administered to the respective subject, accessing for a first subset of the medical images, metadata indicating a respective contrast phase, wherein a second subset of the medical images are unassociated with metadata, mapping each respective contrast phase of the contrast phases to a respective time interval indicating estimated amount of time from a start of contrast administration to time of capture of the respective medical image, creating a training dataset, by labelling images of the first subset with a label indicating the respective time interval, and including the second subset as non-labelled images, and training the ML model using the training dataset for generating an outcome of a target time interval indicating estimated amount of time from the start of contrast administration, in response to an input of a target medical image.

Abstract: A system, method and computer readable medium for examining a specimen, the method comprising: obtaining defects of interest (DOIs) and false alarms (FAs) from a review subset selected from a group of potential defects received from an inspection tool, each potential defect is associated with attribute values defining a location of the potential defect in an attribute space; generating a representative subset of the group, comprising potential defects selected in accordance with a distribution of the potential defects within the attribute space, and indicating the potential defects in the representative subset as FA; and training a classifier using data informative of the attribute values of the DOIs, the potential defects of the representative subset, and respective indications thereof as DOIs or FAs, wherein the trained classifier is to be applied to at least some of the potential defects to obtain an estimation of a number of expected DOIs.

Abstract: There is provided a system and method of automatic optimization of an examination recipe. The method includes obtaining one or more inspection images each representative of at least a portion of the semiconductor specimen, the one or more inspection images being indicative of respective defect candidates selected from a defect map using a first classifier included in the examination recipe; obtaining label data respectively associated with the one or more inspection images and informative of types of the respective defect candidates; extracting inspection features characterizing the one or more inspection images; retraining the first classifier using the first features and the label data, giving rise to a second classifier; and optimizing the examination recipe by replacing the first classifier with the second classifier; wherein the optimized examination recipe is usable for examining a subsequent semiconductor specimen.

Abstract: Disclosed is a system, method and computer readable medium for selecting a coreset of potential defects for estimating expected defects of interest. An example method includes obtaining a plurality of defects of interest (DOIs) and false alarms (FAs) from a review subset selected from a group of potential defects received from an inspection tool. The method further includes generating a representative subset of the group of potential defects. The representative subset includes potential defects selected in accordance with a distribution of the group of potential defects within an attribute space. The method further includes, upon training a classifier using data informative of the attribute values of the DOIs, the potential defects of the representative subset, and respective indications thereof as DOIs or FAs, applying the classifier to at least some of the potential defects to obtain an estimation of a number of expected DOIs in the specimen.