Abstract: Disclosed herein is a system for magnetic testing of samples. The system includes: (i) a magnetic field generator configured to, by rotating a magnet(s), which is permanent, produce a temporally modulated magnetic field over a region whereat a sample is positioned; (ii) a waveguide positioned adjacently to the sample; (iii) a first sensor configured to obtain a first signal by directly and/or indirectly measuring a modulation rate of the produced magnetic field; (iv) an electromagnetic signal generator coupled to a first end of the waveguide; (v) a second sensor coupled to a second end of the waveguide and configured to obtain a measured signal by measuring a power of an electromagnetic signal transmitted through the waveguide; and (vi) a heterodyne-based demodulator communicatively associated with the first and second sensors and configured to use a reference signal, constituted by or obtained from the first signal, to demodulate the measured signal.

Abstract: A method of generating light is disclosed. The method comprises: directing an optical pulse to a semiconductor optical amplifier being at a temperature above 0° C. The optical pulse is preferably characterized by a wavelength within an emission spectrum of the semiconductor optical amplifier and by a pulse area selected to induce Rabi oscillations in the semiconductor optical amplifier, and to emit light at a frequency of at least 1 THz.

Abstract: A method of generating light is disclosed. The method comprises: directing an optical pulse to a semiconductor optical amplifier being at a temperature above 0° C. The optical pulse is preferably characterized by a wavelength within an emission spectrum of the semiconductor optical amplifier and by a pulse area selected to induce Rabi oscillations in the semiconductor optical amplifier, and to emit light at a frequency of at least 1 THz.