Patents by Inventor Amir Komem

Amir Komem has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6628381
    Abstract: Method and apparatus for optical inspection of a patterned article are presented. A region on the article is illuminated with incident light to produce light returned from the illuminated region. An image of the illuminated region is acquired and analyzed for determining the intensity distribution of light components scattered from the pattern of the illuminated region within a certain collection angular field located outside a solid angle of propagation of specularly reflected light. Based on the determined distribution, light components scattered from the illuminated region and propagating with at least one predetermined solid angle segment of the certain collection angle are collected and directed to a dark-field detection unit.
    Type: Grant
    Filed: June 20, 2000
    Date of Patent: September 30, 2003
    Assignee: Applied Materials, Inc.
    Inventors: Amir Komem, Erel Milshtein
  • Patent number: 6469784
    Abstract: Method and apparatus for optical inspection of an article are presented. The apparatus comprises an illumination unit and at least one detection unit. The illumination unit generates an incident beam and directs it onto a predetermined region of the article. The detection unit includes a light collection system and a detector. The light collection system collects light scattered from the illuminated region with a predetermined constant maximum collection angle, and utilizes a variable angle design for selectively selecting from collected light at least one light component propagating with a solid angle segment of the maximum collection angle, and directing it to the detector.
    Type: Grant
    Filed: August 30, 2001
    Date of Patent: October 22, 2002
    Assignee: Applied Materials, Inc.
    Inventors: Boris Golberg, Amir Komem, Ron Naftali, Gilad Almogy
  • Patent number: 6366352
    Abstract: Method and apparatus for optical inspection of an article are presented. The apparatus comprises an illumination unit and at least one detection unit. The illumination unit generates an incident beam and directs it onto a predetermined region of the article. The detection unit includes a light collection system and a detector. The light collection system collects light scattered from the illuminated region with a predetermined constant maximum collection angle, and utilizes a variable angle design for selectively selecting from collected light at least one light component propagating with a solid angle segment of the maximum collection angle, and directing it to the detector.
    Type: Grant
    Filed: June 10, 1999
    Date of Patent: April 2, 2002
    Assignee: Applied Materials, Inc.
    Inventors: Boris Goldberg, Amir Komem, Ron Naftali, Gilad Almogy
  • Publication number: 20020005947
    Abstract: Method and apparatus for optical inspection of an article are presented. The apparatus comprises an illumination unit and at least one detection unit. The illumination unit generates an incident beam and directs it onto a predetermined region of the article. The detection unit includes a light collection system and a detector. The light collection system collects light scattered from the illuminated region with a predetermined constant maximum collection angle, and utilizes a variable angle design for selectively selecting from collected light at least one light component propagating with a solid angle segment of the maximum collection angle, and directing it to the detector.
    Type: Application
    Filed: August 30, 2001
    Publication date: January 17, 2002
    Applicant: APPLIED MATERIALS, INC.
    Inventors: Boris Golberg, Amir Komem, Ron Naftali, Gilad Almogy
  • Patent number: 6208369
    Abstract: An imaging system for imaging a plurality of macropixels onto a media and a method for generating a linear array of macropixels to be imaged onto a media utilizing a two dimensional spatial light modulator having a plurality of micropixels grouped together to form a plurality of linear arrays of macropixels is provided. The imaging system includes a light source for generating a beam of light; a projection lens assembly for focusing the beam of light; a deflector illuminated by the light beam output from the projection lens assembly, the deflector able to deflect the light beam in the vertical (Y-axis) direction; an anamorphic lens assembly illuminated with the light beam output from the deflector; a two dimensional spatial light modular (SLM) including a plurality of micropixels, the plurality of micropixels grouped together to form a plurality of linear arrays of the micropixels, and an imaging lens assembly coupled to the output of the spatial light modulator.
    Type: Grant
    Filed: August 14, 1997
    Date of Patent: March 27, 2001
    Assignee: CreoScitex Corporation Ltd.
    Inventors: Iian Ben Oren, Serge Steinblatt, Amir Komem
  • Patent number: 5969872
    Abstract: A novel optical system operative to transfer, with high efficiency, optical power from a line source, such as a LDB, built from a plurality of individual light sources with different angular distribution in two orthogonal axis into a rectangular area with a particular aspect ratio and two different numerical apertures. The near field pattern of a LDB is imaged onto the plane of an SLM. The system utilizes light generated from an LDB having a plurality of individual light sources to illuminate a microlens array. The microlens array, consisting of a plurality of microlenses, functions to collimate the light from the LDB in the slow axis. An optical element adjacent the microlens array refracts the light in the fast axis. In the slow axis, the light from the microlens array is incident upon an optical element which focuses the light onto the SLM plane such that the light from each point light source illuminates the entire active pixel area of the SLM.
    Type: Grant
    Filed: January 11, 1999
    Date of Patent: October 19, 1999
    Assignee: Scitex Corporation Ltd.
    Inventors: Ilan Ben Oren, Josef Ronen, Serge Steinblatt, Amir Komem
  • Patent number: 5900981
    Abstract: A novel optical system operative to transfer, with high efficiency, optical power from a line source, such as a LDB, built from a plurality of individual light sources with different angular distribution in two orthogonal axis into a rectangular area with a particular aspect ratio and two different numerical apertures. The near field pattern of a LDB is imaged onto the plane of an SLM. The system utilizes light generated from an LDB having a plurality of individual light sources to illuminate a microlens array. The microlens array, consisting of a plurality of microlenses, functions to collimate the light from the LDB in the slow axis. An optical element adjacent the microlens array refracts the light in the fast axis. In the slow axis, the light from the microlens array is incident upon an optical element which focuses the light onto the SLM plane such that the light from each point light source illuminates the entire active pixel area of the SLM.
    Type: Grant
    Filed: April 15, 1997
    Date of Patent: May 4, 1999
    Assignee: Scitex Corporation Ltd.
    Inventors: Ilan Ben Oren, Josef Ronen, Serge Steinblatt, Amir Komem