Patents by Inventor Amir Valiani

Amir Valiani has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Diagnosability system
    Patent number: 7937623
    Abstract: A diagnosability system for automatically collecting, storing, communicating, and analyzing diagnostic data for one or more monitored systems. The diagnosability system comprises several components configured for the collection, storage, communication, and analysis of diagnostic data for a condition detected in monitored system. The diagnosability system enables targeted dumping of diagnostic data so that only diagnostic data that is relevant for diagnosing the condition detected in the monitored system is collected and stored. This in turn enables first failure analysis thereby reducing the time needed to resolve the condition detected in the monitored system.
    Type: Grant
    Filed: October 15, 2008
    Date of Patent: May 3, 2011
    Assignee: Oracle International Corporation
    Inventors: Mark Ramacher, Gary Ngai, Benoit Dageville, Karl Dias, Yair Sarig, Marcus Fallen, Ajith Kumar Mysorenagarajarao, John Beresniewicz, Mike Feng, Jonathan Klein, Hailing Yu, Leng Tan, Balasubrahmanya Kuchibhotla, Uri Shaft, Venkateshwaran Venkataramani, Amir Valiani
  • DIAGNOSABILITY SYSTEM
    Publication number: 20090106278
    Abstract: A diagnosability system for automatically collecting, storing, communicating, and analyzing diagnostic data for one or more monitored systems. The diagnosability system comprises several components configured for the collection, storage, communication, and analysis of diagnostic data for a condition detected in monitored system. The diagnosability system enables targeted dumping of diagnostic data so that only diagnostic data that is relevant for diagnosing the condition detected in the monitored system is collected and stored. This in turn enables first failure analysis thereby reducing the time needed to resolve the condition detected in the monitored system.
    Type: Application
    Filed: October 15, 2008
    Publication date: April 23, 2009
    Applicant: Oracle International Corporation
    Inventors: Mark Ramacher, Gary Ngai, Benoit Dageville, Karl Dias, Yair Sarig, Marcus Fallen, Ajith Kumar Mysorenagarajarao, John Beresniewicz, Mike Feng, Jonathan Klein, Hailing Yu, Leng Tan, Balasubrahmanyam Kuchibhotla, Uri Shaft, Venkateshwaran Venkataramani, Amir Valiani