Patents by Inventor Amir Zatlzman

Amir Zatlzman has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and device for high speed testing of an integrated circuit
    Patent number: 7689897
    Abstract: An integrated circuit and a method for testing an integrated circuit.
    Type: Grant
    Filed: May 19, 2005
    Date of Patent: March 30, 2010
    Assignee: Freescale Semiconductor, Inc.
    Inventors: Michael Priel, Eyal Salomon, Amir Zatlzman