Patents by Inventor Amit Jhaamb

Amit Jhaamb has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Software testing management
    Patent number: 10007597
    Abstract: A system may scan a version control repository to detect a first code and/or a first file written for a first test framework. The system may create a first test case in an SOR in response to detecting the first code and/or the first file. The system may scan the version control repository to detect a second code and/or a second file written for a second test framework with the second test framework being different from the first test framework. The system may create a second test case in the SOR in response to detecting the second code and/or the second file.
    Type: Grant
    Filed: September 23, 2016
    Date of Patent: June 26, 2018
    Assignee: AMERICAN EXPRESS TRAVEL RELATED SERVICES COMPANY, INC.
    Inventors: Lee Barnett, Krista Freiland, Satish Jayaraman, Amit Jhaamb, Manish Joon, Jeff Nunn
  • SOFTWARE TESTING MANAGEMENT
    Publication number: 20180089066
    Abstract: A system may scan a version control repository to detect a first code and/or a first file written for a first test framework. The system may create a first test case in an SOR in response to detecting the first code and/or the first file. The system may scan the version control repository to detect a second code and/or a second file written for a second test framework with the second test framework being different from the first test framework. The system may create a second test case in the SOR in response to detecting the second code and/or the second file.
    Type: Application
    Filed: September 23, 2016
    Publication date: March 29, 2018
    Applicant: American Express Travel Related Services Company, Inc.
    Inventors: Lee Barnett, Krista Freiland, Satish Jayaraman, Amit Jhaamb, Manish Joon, Jeff Nunn