Patents by Inventor Amit Majumdar

Amit Majumdar has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for debugging an integrated circuit
    Patent number: 7055135
    Abstract: Embodiments of the present invention provide a method and apparatus for debugging an integrated circuit. In particular, one embodiment of the present invention includes steps of: (a) retrieving data from a design data base, and creating a design pattern in a pattern format, which design pattern includes stimulus data for stimuli to be applied to the integrated circuit and design response data for expected responses to the stimuli; (b) generating, responsive to the design pattern, a tester pattern and a test program for input to a tester; (c) testing the integrated circuit in the tester, responsive to the tester pattern and the test program, and generating a datalog that comprises test response data; and (d) generating a file, responsive to the datalog, wherein the test response data are reformatted into the pattern format.
    Type: Grant
    Filed: May 6, 2002
    Date of Patent: May 30, 2006
    Assignee: Sun Microsystems, Inc.
    Inventors: Hong S. Kim, Amit Majumdar, Sridhar Narayanan
  • Method for debugging an integrated circuit
    Publication number: 20030208747
    Abstract: Embodiments of the present invention provide a method and apparatus for debugging an integrated circuit. In particular, one embodiment of the present invention includes steps of: (a) retrieving data from a design data base, and creating a design pattern in a pattern format, which design pattern includes stimulus data for stimuli to be applied to the integrated circuit and design response data for expected responses to the stimuli; (b) generating, responsive to the design pattern, a tester pattern and a test program for input to a tester; (c) testing the integrated circuit in the tester, responsive to the tester pattern and the test program, and generating a datalog that comprises test response data; and (d) generating a file, responsive to the datalog, wherein the test response data are reformatted into the pattern format.
    Type: Application
    Filed: May 6, 2002
    Publication date: November 6, 2003
    Applicant: SUN MICROSYSTEMS, INC.
    Inventors: Hong S. Kim, Amit Majumdar, Sridhar Narayanan