Patents by Inventor Amit P. Vasavada

Amit P. Vasavada has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System and method for estimating test escapes in integrated circuits
    Patent number: 7865849
    Abstract: A method for designing an integrated circuit including estimating a test escape rate for tests of interest, a test coverage calculator and a system for estimating a test escape rate for tests of interest associated with a portion of an integrated circuit (IC) die. In one embodiment the method includes the step of: estimating a test escape rate for a set of fault tests to be performed on an IC under design based on an estimated yield and a combined coverage of the set of fault tests; the combined coverage accounting for overlapping coverage among the set of fault tests.
    Type: Grant
    Filed: February 15, 2008
    Date of Patent: January 4, 2011
    Assignee: Texas Instruments Incorporated
    Inventors: Kenneth M. Butler, John M. Carulli, Jr., Jayashree Saxena, Amit P. Vasavada
  • SYSTEM AND METHOD FOR ESTIMATING TEST ESCAPES IN INTEGRATED CIRCUITS
    Publication number: 20090210830
    Abstract: A method for designing an integrated circuit including estimating a test escape rate for tests of interest, a test coverage calculator and a system for estimating a test escape rate for tests of interest associated with a portion of an integrated circuit (IC) die. In one embodiment the method includes the step of: estimating a test escape rate for a set of fault tests to be performed on an IC under design based on an estimated yield and a combined coverage of the set of fault tests; the combined coverage accounting for overlapping coverage among the set of fault tests.
    Type: Application
    Filed: February 15, 2008
    Publication date: August 20, 2009
    Applicant: Texas Instruments Incorporated
    Inventors: Kenneth M. Butler, John M. Carulli, JR., Jayashree Saxena, Amit P. Vasavada