Patents by Inventor Amit Paliwal

Amit Paliwal has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12137265
    Abstract: Disclosed herein are system, apparatus, article of manufacture, method and/or computer program product embodiments, and/or combinations and sub-combinations thereof, for modifying one or more parameters of a data streaming bitrate selection algorithm based on machine learning. An example embodiment operates by training and operating a first machine learning model to predict a sustainable network bandwidth. A second machine learning model is trained to receive the sustainable network bandwidth and predict a likelihood that this network bandwidth will not empty a data buffer of streaming data. A bitrate is selected based on the likelihood being below a threshold percentage, such as 50%.
    Type: Grant
    Filed: September 7, 2023
    Date of Patent: November 5, 2024
    Assignee: Roku, Inc.
    Inventors: Amit Paliwal, Andrey Marsavin, Govind Vaidya, Wim Michiels, Beth Teresa Logan, Zheng Han, Tapan Oza, Vijay Anand Raghavan
  • Publication number: 20240329122
    Abstract: A device under test (DUT) structure for voltage contrast (VC) detection of contact opens comprises a fin formed along a first direction over a substrate, the fin having a diffusion region, the fin doped to form i) a p-type fin and a p-type diffusion region or ii) an n-type fin and an n-type diffusion region. A trench contact (TCN) segment is along a second direction generally orthogonal to the first direction over the fin and in contact with the diffusion region. A floating gate is generally parallel to the TCN segment over the fin, wherein the floating gate and the TCN segment are not in contact, and the floating gate does not have a via formed thereon.
    Type: Application
    Filed: March 30, 2023
    Publication date: October 3, 2024
    Inventors: Sairam SUBRAMANIAN, Amit PALIWAL, Xiao WEN, Dipto THAKURTA
  • Publication number: 20240329114
    Abstract: An integrated circuit on a production die comprises a device under test (DUT) cell array formed in a fill region on the production die, the DUT cell array comprising a plurality of DUT transistor structures configured for voltage contrast (VC) detection of electrical opens on the production die. The DUT transistor structures comprise one or more vias that are not located on power lines or signal lines, such that the DUT transistor structures are not connected to each other or to the electrically functioning transistors. A guard ring buffer is formed at a transition between the active transistor region and the DUT cell array.
    Type: Application
    Filed: March 30, 2023
    Publication date: October 3, 2024
    Inventors: Sairam Subramanian, Amit Paliwal, Xiao Wen, Dipto Thakurta, Manish Sharma, Daniel Murray
  • Patent number: 12013442
    Abstract: Embodiments of the present disclosure relate to in-line detection of electrical fails on integrated circuits. One embodiment is an apparatus including a device region with integrated circuits and a test region for in-line failure detection of the integrated circuits using an in-line voltage contrast test, the apparatus comprising: a substrate including a first area for the device region and a second different area for the test region; metal layers formed over both areas; wherein the integrated circuits are formed from first sections of the layers; and wherein a second section of an upper metal layer of the layers is segmented into test segments, each test segment to exhibit a predefined response during the in-line voltage contrast test depending on whether the test segment is shorted, or not, to the substrate and/or the second section of a gate layer of the layer. Other embodiments may be disclosed and/or claimed.
    Type: Grant
    Filed: September 28, 2018
    Date of Patent: June 18, 2024
    Assignee: Intel Corporation
    Inventors: Enlan Yuan, David Sanchez, Amit Paliwal, Manish Sharma, Sairam Subramanian, Sagar Suthram
  • Publication number: 20240112962
    Abstract: Embodiments disclosed herein include an apparatus for alignment detection. In an embodiment, the apparatus comprises a substrate, and a plurality of devices on the substrate, where each of the plurality of devices comprises a process monitor structure with different offsets from a target value. In an embodiment, a plurality of electrically conductive traces are on the substrate, where each of the plurality of electrically conductive traces has a first end and a second end opposite the first end, and where each of the plurality of electrically conductive traces is electrically coupled at the first end, respectively, with each of the plurality of devices. In an embodiment, the second end of the each of the plurality of electrical traces is within a scan area on the substrate, and where the each of the plurality of electrically conductive traces are not directly electrically coupled with each other.
    Type: Application
    Filed: September 30, 2022
    Publication date: April 4, 2024
    Inventors: Xiao WEN, Dipto THAKURTA, Sairam SUBRAMANIAN, David SANCHEZ, Amit PALIWAL
  • Publication number: 20230421831
    Abstract: Disclosed herein are system, apparatus, article of manufacture, method and/or computer program product embodiments, and/or combinations and sub-combinations thereof, for modifying one or more parameters of a data streaming bitrate selection algorithm based on machine learning. An example embodiment operates by training and operating a first machine learning model to predict a sustainable network bandwidth. A second machine learning model is trained to receive the sustainable network bandwidth and predict a likelihood that this network bandwidth will not empty a data buffer of streaming data. A bitrate is selected based on the likelihood being below a threshold percentage, such as 50%.
    Type: Application
    Filed: September 7, 2023
    Publication date: December 28, 2023
    Applicant: ROKU, INC.
    Inventors: Amit Paliwal, Andrey Marsavin, Govind Vaidya, Wim Michiels, Beth Teresa Logan, Zheng Han, Tapan Oza, Vijay Anand Raghavan
  • Patent number: 11800167
    Abstract: Disclosed herein are system, apparatus, article of manufacture, method and/or computer program product embodiments, and/or combinations and sub-combinations thereof, for modifying one or more parameters of a data streaming bitrate selection algorithm based on machine learning. An example embodiment operates by training and operating a first machine learning model to predict a sustainable network bandwidth. A second machine learning model is trained to receive the sustainable network bandwidth and predict a likelihood that this network bandwidth will not empty a data buffer of streaming data. A bitrate is selected based on the likelihood being below a threshold percentage, such as 50%.
    Type: Grant
    Filed: October 29, 2021
    Date of Patent: October 24, 2023
    Assignee: ROKU, INC.
    Inventors: Amit Paliwal, Andrey Marsavin, Govind Vaidya, Wim Michiels, Beth Teresa Logan, Zheng Han, Tapan Oza, Vijay Anand Raghavan
  • Publication number: 20230133880
    Abstract: Disclosed herein are system, apparatus, article of manufacture, method and/or computer program product embodiments, and/or combinations and sub-combinations thereof, for modifying one or more parameters of a data streaming bitrate selection algorithm based on machine learning. An example embodiment operates by training and operating a first machine learning model to predict a sustainable network bandwidth. A second machine learning model is trained to receive the sustainable network bandwidth and predict a likelihood that this network bandwidth will not empty a data buffer of streaming data. A bitrate is selected based on the likelihood being below a threshold percentage, such as 50%.
    Type: Application
    Filed: October 29, 2021
    Publication date: May 4, 2023
    Inventors: Amit PALIWAL, Andrey MARSAVIN, Govind VAIDYA, Wim MICHIELS, Beth Teresa LOGAN, Zheng HAN, Tapan OZA, Vijay Anand RAGHAVAN
  • Patent number: 11115394
    Abstract: Embodiments provide methods, and systems for encrypting data for web aplication. A method includes receiving, by a server system, a cryptographic certificate including asymmetric key pair. The method includes generating a random value key that forms at least a part of a Content Encryption Key (CEK) to be generated by a web application. The method includes sending the random value key to a client device running the web application over a secure network communication channel for generating the CEK. The CEK is to be utilized for encrypting a content entered by a user of the web application on the client device and the CEK is encrypted using a public key of the asymmetric key pair for transmission over the secure network communication channel. Furthermore, the method includes translating, the CEK encrypted under public key to CEK encrypted under LMK using a private key being part of the asymmetric key pair.
    Type: Grant
    Filed: July 10, 2019
    Date of Patent: September 7, 2021
    Assignee: Mastercard International Incorporated
    Inventors: Rupesh Salgaonkar, Anup Yedalawar, Amit Paliwal, Abhinandan Patil, Rahul Prakash Kurde
  • Publication number: 20200103451
    Abstract: Embodiments of the present disclosure relate to in-line detection of electrical fails on integrated circuits. One embodiment is an apparatus including a device region with integrated circuits and a test region for in-line failure detection of the integrated circuits using an in-line voltage contrast test, the apparatus comprising: a substrate including a first area for the device region and a second different area for the test region; metal layers formed over both areas; wherein the integrated circuits are formed from first sections of the layers; and wherein a second section of an upper metal layer of the layers is segmented into test segments, each test segment to exhibit a predefined response during the in-line voltage contrast test depending on whether the test segment is shorted, or not, to the substrate and/or the second section of a gate layer of the layer. Other embodiments may be disclosed and/or claimed.
    Type: Application
    Filed: September 28, 2018
    Publication date: April 2, 2020
    Inventors: Enlan YUAN, David SANCHEZ, Amit PALIWAL, Manish SHARMA, Sairam SUBRAMANIAN, Sagar SUTHRAM
  • Publication number: 20200021567
    Abstract: Embodiments provide methods, and systems for encrypting data for web aplication. A method includes receiving, by a server system, a cryptographic certificate including asymmetric key pair. The method includes generating a random value key that forms at least a part of a Content Encryption Key (CEK) to be generated by a web application. The method includes sending the random value key to a client device running the web application over a secure network communication channel for generating the CEK. The CEK is to be utilized for encrypting a content entered by a user of the web application on the client device and the CEK is encrypted using a public key of the asymmetric key pair for transmission over the secure network communication channel. Furthermore, the method includes translating, the CEK encrypted under public key to CEK encrypted under LMK using a private key being part of the asymmetric key pair.
    Type: Application
    Filed: July 10, 2019
    Publication date: January 16, 2020
    Applicant: Mastercard International Incorporated
    Inventors: Rupesh Salgaonkar, Anup Yedalawar, Amit Paliwal, Abhinandan Patil, Rahul Prakash Kurde