Patents by Inventor Amit V. Engineer

Amit V. Engineer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and system for machine vision-based feature detection and mark verification in a workpiece or wafer marking system
    Patent number: RE41924
    Abstract: A system and method for inspecting machine readable marks on one side of a wafer without requiring transmission of radiant energy from another side of the wafer and through the wafer. The wafer has articles which may include die, chip scale packages, circuit patterns and the like. The marking occurs in a wafer marking system and within a designated region relative to an article position. The articles have a pattern on a first side. The method includes the steps of imaging a first side of the wafer, imaging a second side of the wafer, establishing correspondence between a portion of first side image and a portion of a second side image, and superimposing image data from the first and second sides to determine at least the position of a mark relative to an article.
    Type: Grant
    Filed: November 30, 2007
    Date of Patent: November 16, 2010
    Assignee: GSI Group Corporation
    Inventors: Christian Nemets, Michael Woelki, Amit V. Engineer