Patents by Inventor Amitabh Tandon

Amitabh Tandon has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240070204
    Abstract: A current set of context features for a database query that is associated with a string is identified. The database query includes a sequence of tokens of a database syntax, and the current set of context features includes words from the string and tokens from the database query. An inference record is selected from an inference store based on a comparison of the current set of context features to context features of inference records in the inference store. The database query is modified using a resolution of the inference record to obtain an inferred database query. The resolution includes one or more tokens of the database syntax. A search of a database is invoked using a query based on the inferred database query to obtain search results.
    Type: Application
    Filed: September 1, 2023
    Publication date: February 29, 2024
    Inventors: Amit Prakash, Ravi Tandon, Manikanta Venkata Rahul Balakavi, Pavan Ram Piratla, Ashish Shubham, Alonzo Canada, Rakesh Kothari, Maneesh Apte, Amitabh Singhal, Aditya Viswanathan, Ajeet Singh
  • Patent number: 7499815
    Abstract: A system and method for readily generating radial clearance data for a radial clearance between locations on at least two parts in a rotating machine includes rendering an image of a cross section view of at least a portion of the machine on a display. The locations on the two parts are identified on the rendered cross section, and a radial stack path between the identified locations is automatically determined. The radial clearance between the identified locations when the machine is not operating is determined, based at least in part on the determined radial stack path. Data generated by a deflection analysis model of the machine are used to determine radial deflections of the identified locations during machine operation at one or more machine operating conditions. Data representative of the radial clearance between the identified locations during the machine operation at the one or more machine operating conditions are generated.
    Type: Grant
    Filed: November 2, 2006
    Date of Patent: March 3, 2009
    Assignee: Honeywell International Inc.
    Inventors: Dave G. Dischinger, Charles P. Silcox, Amitabh Tandon, Muralidharan Kendai, Karthikeswaran Kalusivalingam
  • Publication number: 20080109195
    Abstract: A system and method for readily generating radial clearance data for a radial clearance between locations on at least two parts in a rotating machine includes rendering an image of a cross section view of at least a portion of the machine on a display. The locations on the two parts are identified on the rendered cross section, and a radial stack path between the identified locations is automatically determined. The radial clearance between the identified locations when the machine is not operating is determined, based at least in part on the determined radial stack path. Data generated by a deflection analysis model of the machine are used to determine radial deflections of the identified locations during machine operation at one or more machine operating conditions. Data representative of the radial clearance between the identified locations during the machine operation at the one or more machine operating conditions are generated.
    Type: Application
    Filed: November 2, 2006
    Publication date: May 8, 2008
    Inventors: Dave G. Dischinger, Charles P. Silcox, Amitabh Tandon, Muralidharan Kendai, Karthikeswaran K. Kalusivalingam