Patents by Inventor Amitabha Dutta

Amitabha Dutta has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7521917
    Abstract: In accordance with one embodiment, the present technique provides a testing apparatus for testing material integrity in an object. The testing apparatus includes an electrical conductor and a sensing device. In the exemplary testing device, the electrical conductor extends in a generally linear direction and is configured to route current in a direction generally transverse to a longitudinal axis of the object being tested. Routing of current through the electrical conductor creates remote field eddy current effect, which, in turn, affects a magnetic field around the test object. The testing apparatus also includes a sensing device located at a distance from the electrical conductor and configured to detect magnetic fields generated in response to current routed through the electrical conductor.
    Type: Grant
    Filed: June 25, 2004
    Date of Patent: April 21, 2009
    Assignee: General Electric Company
    Inventors: Gopichand Katragadda, Manoj Kumar Koyithitta Meethal, Slvaramanivas Ramaswamy, Amitabha Dutta
  • Patent number: 7234355
    Abstract: A method and system for detecting weld signatures from an ultrasound scan data obtained from scanning a pipeline is provided. The method includes a step for mapping multiple amplitude responses from the ultrasound scan data, each amplitude response being representative of a respective sensor signal. Continuous amplitude responses are located from the amplitude responses and corresponding signatures are identified for the continuous amplitude responses. The method also includes a step for tagging the corresponding signatures as weld signatures.
    Type: Grant
    Filed: December 27, 2004
    Date of Patent: June 26, 2007
    Assignee: General Electric Company
    Inventors: Sandeep Kumar Dewangan, Anandraj Sengupta, Amitabha Dutta
  • Patent number: 7233867
    Abstract: An eddy current inspection system and method for inspecting a component is provided. The system includes an eddy current probe for sensing eddy currents from the component and an analog to digital converter configured for converting eddy currents to digital signals. The system also includes a processor configured for generating an eddy current image from the digital signals and pre-processing the image to enhance a quality of the image. The processor is configured to identify regions displaying flaw patterns and calculating a defect characterizing parameter for the identified regions.
    Type: Grant
    Filed: April 6, 2005
    Date of Patent: June 19, 2007
    Assignee: General Electric Company
    Inventors: Preeti Pisupati, Gigi Olive Gambrell, Shyamsunder Tondanur Mandayam, Amitabha Dutta
  • Publication number: 20060229833
    Abstract: An eddy current inspection system and method for inspecting a component is provided. The system includes an eddy current probe for sensing eddy currents from the component and an analog to digital converter configured for converting eddy currents to digital signals. The system also includes a processor configured for generating an eddy current image from the digital signals and pre-processing the image to enhance a quality of the image. The processor is configured to identify regions displaying flaw patterns and calculating a defect characterizing parameter for the identified regions.
    Type: Application
    Filed: April 6, 2005
    Publication date: October 12, 2006
    Inventors: Preeti Pisupati, Gigi Gambrell, MT Shyamsunder, Amitabha Dutta
  • Publication number: 20060137451
    Abstract: A method and system for detecting weld signatures from an ultrasound scan data obtained from scanning a pipeline is provided. The method includes a step for mapping multiple amplitude responses from the ultrasound scan data, each amplitude response being representative of a respective sensor signal. Continuous amplitude responses are located from the amplitude responses and corresponding signatures are identified for the continuous amplitude responses. The method also includes a step for tagging the corresponding signatures as weld signatures.
    Type: Application
    Filed: December 27, 2004
    Publication date: June 29, 2006
    Inventors: Sandeep Dewangan, Anandraj Sengupta, Amitabha Dutta
  • Publication number: 20050285588
    Abstract: In accordance with one embodiment, the present technique provides a testing apparatus for testing material integrity in an object. The testing apparatus includes an electrical conductor and a sensing device. In the exemplary testing device, the electrical conductor extends in a generally linear direction and is configured to route current in a direction generally transverse to a longitudinal axis of the object being tested. Routing of current through the electrical conductor creates remote field eddy current effect, which, in turn, affects a magnetic field around the test object. The testing apparatus also includes a sensing device located at a distance from the electrical conductor and configured to detect magnetic fields generated in response to current routed through the electrical conductor.
    Type: Application
    Filed: June 25, 2004
    Publication date: December 29, 2005
    Inventors: Gopichand Katragadda, Manoj Meethal, Sivaramanivas Ramaswamy, Amitabha Dutta