Patents by Inventor Amol Ashok Lele

Amol Ashok Lele has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Debugging and profiling of machine learning model training
    Patent number: 12039415
    Abstract: Methods, systems, and computer-readable media for debugging and profiling of machine learning model training are disclosed. A machine learning analysis system receives data associated with training of a machine learning model. The data was collected by a machine learning training cluster. The machine learning analysis system performs analysis of the data associated with the training of the machine learning model. The machine learning analysis system detects one or more conditions associated with the training of the machine learning model based at least in part on the analysis. The machine learning analysis system generates one or more alarms describing the one or more conditions associated with the training of the machine learning model.
    Type: Grant
    Filed: September 30, 2019
    Date of Patent: July 16, 2024
    Assignee: Amazon Technologies, Inc.
    Inventors: Andrea Olgiati, Lakshmi Naarayanan Ramakrishnan, Jeffrey John Geevarghese, Denis Davydenko, Vikas Kumar, Rahul Raghavendra Huilgol, Amol Ashok Lele, Stefano Stefani, Vladimir Zhukov
  • DEBUGGING AND PROFILING OF MACHINE LEARNING MODEL TRAINING
    Publication number: 20210097431
    Abstract: Methods, systems, and computer-readable media for debugging and profiling of machine learning model training are disclosed. A machine learning analysis system receives data associated with training of a machine learning model. The data was collected by a machine learning training cluster. The machine learning analysis system performs analysis of the data associated with the training of the machine learning model. The machine learning analysis system detects one or more conditions associated with the training of the machine learning model based at least in part on the analysis. The machine learning analysis system generates one or more alarms describing the one or more conditions associated with the training of the machine learning model.
    Type: Application
    Filed: September 30, 2019
    Publication date: April 1, 2021
    Applicant: Amazon Technologies, Inc.
    Inventors: Andrea Olgiati, Lakshmi Naarayanan Ramakrishnan, Jeffrey John Geevarghese, Denis Davydenko, Vikas Kumar, Rahul Raghavendra Huilgol, Amol Ashok Lele, Stefano Stefani, Vladimir Zhukov