Abstract: A natural language system may be configured to act as a participant in a conversation between two users. The system may determine when a user expression such as speech, a gesture, or the like is directed from one user to the other. The system may processing input data related the expression (such as audio data, input data, language processing result data, conversation context data, etc.) to determine if the system should interject a response to the user-to-user expression. If so, the system may process the input data to determine a response and output it. The system may track that response as part of the data related to the ongoing conversation.

Abstract: A method and apparatus for inspecting a semiconductor wafer provides real-time information identifying tools visited by wafers under inspection and the process parameters used at those tools, and displays this information at the wafer inspection tool. Embodiments include inspecting a wafer using an inspection tool, such as a CCD imager, generating a list of the tools visited by the wafer from data retrieved from a conventional manufacturing execution system and displaying the list at the inspection tool, along with a defect map. The user may then request that a set of process parameters and tool parameters for any of the tools identified on the list be displayed at the inspection tool. Thus, at the time that defects are discovered, the user is automatically provided with a list of the tools visited by the wafer and has easy access to the process parameters used at each of those tools.

Abstract: A yield enhancement system organizes defect classification and attribute information into a global classification scheme. The global classes are used to identify defect sources and to generate inspection and review plans. The system accumulates defect information in a database and continually refines the information to improve the accuracy of the classification assignments and the identification of the defect sources.

Abstract: A yield enhancement system organizes defect classification and attribute information into a global classification scheme. The global classes are used to identify defect sources and to generate inspection and review plans. The system accumulates defect information in a database and continually refines the information to improve the accuracy of the classification assignments and the identification of the defect sources.

Abstract: A system, method and medium for configuring an item such as a machine having multiple optional components is provided. This is accomplished using “options,” which correspond to the optional components of the machine, and are selected by a user according to those optional components that the user desires to have as part of the machine. Each option is envisioned to be created to contain the necessary properties (such as attributes and constraints) to appropriately configure the corresponding optional component within the machine. Embodiments of the present invention envision that the options can be arranged in a hierarchical option tree to help allow a user to better visualize the structure of the machine in making decisions concerning configuration.