Patents by Inventor Amr Safwat

Amr Safwat has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Probe for testing a device under test
    Publication number: 20080054923
    Abstract: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
    Type: Application
    Filed: October 24, 2007
    Publication date: March 6, 2008
    Inventors: K. Gleason, Tim Lesher, Eric Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr Safwat
  • Probe for testing a device under test
    Publication number: 20080054929
    Abstract: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
    Type: Application
    Filed: October 24, 2007
    Publication date: March 6, 2008
    Inventors: K. Gleason, Tim Lesher, Eric Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr Safwat
  • Probe for testing a device under test
    Publication number: 20080048692
    Abstract: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
    Type: Application
    Filed: October 24, 2007
    Publication date: February 28, 2008
    Inventors: K. Gleason, Tim Lesher, Eric Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr Safwat
  • Probe for testing a device under test
    Publication number: 20080024149
    Abstract: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
    Type: Application
    Filed: September 27, 2007
    Publication date: January 31, 2008
    Inventors: K. Gleason, Tim Lesher, Eric Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr Safwat
  • Probe for testing a device under test
    Publication number: 20070075716
    Abstract: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
    Type: Application
    Filed: December 1, 2006
    Publication date: April 5, 2007
    Inventors: K. Gleason, Tim Lesher, Eric Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr Safwat
  • Test structures and method for interconnect impedance property extraction
    Publication number: 20060022678
    Abstract: A method and test structures are disclosed for characterizing interconnects of an integrated circuit. The method provides a set of test structures and determines a unit impedance property of each test structure, desirably using S-parameter measurements. A reference impedance data set is then formulated that characterizes the impedance of an integrated circuit manufacturing technology and that can be used to characterize the impedance of interconnects of the chip made by the technology. Each test structure desirably comprises a ground grid and a signal line, and is characterized by values of a set of predetermined attributes such as layer location of the respective ground grid, grid density, layer association, width and length of the respective signal line.
    Type: Application
    Filed: October 26, 2004
    Publication date: February 2, 2006
    Inventors: Hazem Hegazy, Amr Safwat, Wael Fikry Abdalla