Patents by Inventor Amrittpal Singh Bath

Amrittpal Singh Bath has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11238057
    Abstract: The disclosed technique can be performed by a data intake and query system. The technique includes ingesting data including log data obtained over a network from systems, and receiving user input indicating a scope for retrieving data and a criterion expressed in a structured language. The technique further includes retrieving data based on the scope indicated by the user input and extracting a first field value and a second field value from the retrieved data based on the criterion and the scope. The first field value includes a first numerical value indicative of a measured characteristic of a computing device and the second field value includes a first dimension. The technique further includes storing a first structured metric and the first dimension in a time-series metrics store. The first structured metric includes the first numerical value. The first dimension is associated with the first numerical value.
    Type: Grant
    Filed: January 31, 2019
    Date of Patent: February 1, 2022
    Assignee: SPLUNK INC.
    Inventors: Amrittpal Singh Bath, Pratiksha Shah, Murugan Kandaswamy, Vishal Patel
  • Patent number: 11188550
    Abstract: The disclosed embodiments include a method performed by a data intake and query system. The method includes ingesting each metric including at least one key value and a measured value taken of a computing resource, and storing each metric in an index of a metrics store, where the index defines at least one dimension populated with the at least one key value and a measure populated with the measured value. The method further includes cataloging metadata in a metrics catalog, where the metadata is related to the metrics stored in the metrics store, performing an analysis of metrics data included in the metrics store and/or the metrics catalog to obtain results, and causing display of the results or an indication of the results on a display device.
    Type: Grant
    Filed: October 31, 2016
    Date of Patent: November 30, 2021
    Assignee: SPLUNK INC.
    Inventors: Thomas Allan Haggie, Clint Sharp, Alexander Douglas James, David Ryan Marquardt, Hailun Yan, Christopher Pride, Vishal Patel, Amrittpal Singh Bath, Pratiksha Shah, Murugan Kandaswamy, Steve Yu Zhang, Ledion Bitincka, David E. Simmen, Marc Andre Chene, Esguerra Ma Kharisma, Igor Stojanovski
  • Patent number: 10657146
    Abstract: The disclosed embodiments include a method performed by a data intake and query system. The method includes ingesting data including raw data obtained over a computer network from a plurality of remote computer systems, and generating events, where each event includes a segment of the raw data and a respective timestamp. The method further includes extracting field values from at least a portion of the raw data of the events, where the field values each include a numerical value, and each numerical value is indicative of a measured characteristic of a computing device. The method further includes generating structured metrics, where each structured metric has a respective numerical value, and indexing the plurality of structured metrics.
    Type: Grant
    Filed: October 31, 2016
    Date of Patent: May 19, 2020
    Assignee: SPLUNK INC.
    Inventors: Amrittpal Singh Bath, Pratiksha Shah, Murugan Kandaswamy, Vishal Patel
  • Patent number: 10606856
    Abstract: The disclosed embodiments include a method performed by a data intake and query system. The method includes ingesting collected data including metrics data including key values and numerical values, where each numerical value is indicative of a measured characteristic of a computing resource (e.g., device), and populating a first portion of a metric-series index (msidx) file with the key values and a second portion of the msidx file with the numerical values. The first portion is distinct from the second portion. The method further includes generating metrics from the metrics data, where each metric has dimensions populated with at least some of the key values and has one of the numerical values. The method further includes indexing the metrics by at least one of the dimensions.
    Type: Grant
    Filed: October 31, 2016
    Date of Patent: March 31, 2020
    Assignee: SPLUNK INC.
    Inventors: Amrittpal Singh Bath, Pratiksha Shah, Murugan Kandaswamy, Vishal Patel
  • Publication number: 20190163678
    Abstract: The disclosed technique can be performed by a data intake and query system. The technique includes ingesting data including log data obtained over a network from systems, and receiving user input indicating a scope for retrieving data and a criterion expressed in a structured language. The technique further includes retrieving data based on the scope indicated by the user input and extracting a first field value and a second field value from the retrieved data based on the criterion and the scope. The first field value includes a first numerical value indicative of a measured characteristic of a computing device and the second field value includes a first dimension. The technique further includes storing a first structured metric and the first dimension in a time-series metrics store. The first structured metric includes the first numerical value. The first dimension is associated with the first numerical value.
    Type: Application
    Filed: January 31, 2019
    Publication date: May 30, 2019
    Inventors: Amrittpal Singh Bath, Pratiksha Shah, Murugan Kandaswamy, Vishal Patel
  • Publication number: 20180089290
    Abstract: The disclosed embodiments include a method performed by a data intake and query system. The method includes ingesting each metric including at least one key value and a measured value taken of a computing resource, and storing each metric in an index of a metrics store, where the index defines at least one dimension populated with the at least one key value and a measure populated with the measured value. The method further includes cataloging metadata in a metrics catalog, where the metadata is related to the metrics stored in the metrics store, performing an analysis of metrics data included in the metrics store and/or the metrics catalog to obtain results, and causing display of the results or an indication of the results on a display device.
    Type: Application
    Filed: October 31, 2016
    Publication date: March 29, 2018
    Inventors: Thomas Allan Haggie, Clint Sharp, Alexander Douglas James, David Ryan Marquardt, Hailun Yan, Christopher Pride, Vishal Patel, Amrittpal Singh Bath, Pratiksha Shah, Murugan Kandaswamy, Steve Yu Zhang, Ledion Bitincka, David E. Simmen, Marc Andre Chene, Esguerra Ma Kharisma, Igor Stojanovski
  • Publication number: 20180089272
    Abstract: The disclosed embodiments include a method performed by a data intake and query system. The method includes ingesting data including raw data obtained over a computer network from a plurality of remote computer systems, and generating events, where each event includes a segment of the raw data and a respective timestamp. The method further includes extracting field values from at least a portion of the raw data of the events, where the field values each include a numerical value, and each numerical value is indicative of a measured characteristic of a computing device. The method further includes generating structured metrics, where each structured metric has a respective numerical value, and indexing the plurality of structured metrics.
    Type: Application
    Filed: October 31, 2016
    Publication date: March 29, 2018
    Inventors: Amrittpal Singh Bath, Pratiksha Shah, Murugan Kandaswamy, Vishal Patel
  • Publication number: 20180089328
    Abstract: The disclosed embodiments include a method performed by a data intake and query system. The method includes ingesting collected data including metrics data including key values and numerical values, where each numerical value is indicative of a measured characteristic of a computing resource (e.g., device), and populating a first portion of a metric-series index (msidx) file with the key values and a second portion of the msidx file with the numerical values. The first portion is distinct from the second portion. The method further includes generating metrics from the metrics data, where each metric has dimensions populated with at least some of the key values and has one of the numerical values. The method further includes indexing the metrics by at least one of the dimensions.
    Type: Application
    Filed: October 31, 2016
    Publication date: March 29, 2018
    Inventors: Amrittpal Singh Bath, Pratiksha Shah, Murugan Kandaswamy, Vishal Patel