Abstract: In an embodiment, a method for managing self-tests in an integrated circuit (IC) includes: receiving built-in-self-test (BIST) configuration data; configuring a first clock to a first frequency based on the BIST configuration data; performing a first BIST test at the first frequency; configuring a second clock to a second frequency that is different from the first frequency; and performing a second BIST test at the second frequency.

Abstract: In an embodiment, an electronic circuit includes: a plurality of signal channels; a signal collection circuit configured to determine an action of the electronic circuit based on channel signals from the plurality of signal channels; and a first signal management circuit coupled between the plurality of signal channels and the signal collection circuit, the first signal management circuit including: a set of internal registers, a set of user registers, and a decoder configured to program the set of internal registers based on a content of the set of user registers, where the first signal management circuit is configured to receive the channel signals via the plurality of signal channels, generate first aggregated signals based on the received channel signals and a content of the set of internal registers, and transmitting the first aggregated signals to the signal collection circuit.

Abstract: In an embodiment, an electronic circuit includes: a plurality of signal channels; a signal collection circuit configured to determine an action of the electronic circuit based on channel signals from the plurality of signal channels; and a first signal management circuit coupled between the plurality of signal channels and the signal collection circuit, the first signal management circuit including: a set of internal registers, a set of user registers, and a decoder configured to program the set of internal registers based on a content of the set of user registers, where the first signal management circuit is configured to receive the channel signals via the plurality of signal channels, generate first aggregated signals based on the received channel signals and a content of the set of internal registers, and transmitting the first aggregated signals to the signal collection circuit.

Abstract: In an embodiment, a method for managing self-tests in an integrated circuit (IC) includes: receiving built-in-self-test (BIST) configuration data; configuring a first clock to a first frequency based on the BIST configuration data; performing a first BIST test at the first frequency; configuring a second clock to a second frequency that is different from the first frequency; and performing a second BIST test at the second frequency.

Abstract: A device for a system on a chip (SOC), the device includes: a comparator that includes a first input port, a second input port, and an output port. A first input signal and a second input signal are split into N bit pairs that include one bit from the first input signal and one bit from the second input signal. The comparator is configured so a mismatch between the first input signal and the second input signal causes an output signal to assume a first expected state. The device further comprises a test controller to perform a first operability test by mismatching the N bit pairs and verifying that the output signal assumes the first expected state.