Abstract: A semiconductor device includes a first conductive feature and a second conductive feature. A first passivation layer is positioned between the first conductive feature and the second conductive feature. A second passivation layer is positioned between the first conductive feature and the second conductive feature and over the first passivation layer. A lowermost portion of an interface where the first passivation layer contacts the second passivation layer is positioned below 40% or above 60% of a height of the first conductive feature.

Abstract: The present disclosure is directed towards genetically engineered TCR-T cells to recognize tumor antigens and simultaneously secrete a binding protein that blocks an immune checkpoint molecule and TGF-beta. These engineered T cells demonstrate stronger antitumor response and reduced T cell exhaustion. The present disclosure provides immunotherapy against HPV- or EBV-positive cancers, among others.

Abstract: An electronic apparatus has a rear cover and a mount assembly coupled to the rear cover. The mount assembly has a first kit coupled to the rear cover and a second kit removably coupled to the first kit. The first kit has a first mount bracket and a kit rib. The second kit has a second mount bracket corresponding to the first mount bracket and an installation corresponding to the kit rib. When the first kit is rotated relative to the second kit, the rotation of the first kit is restricted by a rib assembly between the kit rib and the installation.

Abstract: An integrated circuit (IC) structure includes a substrate, a transistor, an interconnect structure, a plurality of metal lines, an oxide liner, a passivation layer, and a nitride layer. The transistor is on the substrate. The interconnect structure is over the transistor. The metal lines is on the interconnect structure. The oxide liner is over the plurality of metal lines. The passivation layer is over the oxide liner and is more porous than the passivation layer. The nitride layer is over the passivation layer.

Abstract: Due to potential sampling errors (due to small tissue samples not necessarily directly from the developing tumor) and limited optical resolution (˜1 micron), cancer may be missed or detected too late for optimal treatment, or conservative interpretation of indeterminate findings could lead to unnecessary surgery. The novel technology herein—Spatial-domain Low-coherence Quantitative Phase Microscopy (SL-QPM)—can detect structural alterations within cell nuclei with nanoscale sensitivity (0.9 nm) (or nuclear nano-morphology) for “nano-pathological diagnosis” of cancer. SL-QPM uses original, unmodified cytology and histology specimens prepared with standard clinical protocols and stains. SL-QPM can easily integrate in existing clinical pathology laboratories. Results quantified the spatial distribution of optical path length or refractive index in individual nuclei with nanoscale sensitivity, which could be applied to studying nuclear nano-morphology as cancer progresses.

Abstract: A device stand for supporting an electronic panel that is covered by a rear panel includes a first stand surface and a second stand surface that intersects the first stand surface. A plurality of first stand holes in a first hole group is located on the first stand surface and a plurality of second stand holes in a second hole group is located on the second stand surface. The device stand is removably coupled to the rear panel through the plurality of first stand holes when the electronic panel is disposed on a first plane and is removably coupled to the rear panel through the plurality of second stand holes when the electronic panel is mounted on a second plane different from the first plane.

Abstract: A semiconductor device includes a first conductive feature and a second conductive feature. A first passivation layer is positioned between the first conductive feature and the second conductive feature. A second passivation layer is positioned between the first conductive feature and the second conductive feature and over the first passivation layer. A lowermost portion of an interface where the first passivation layer contacts the second passivation layer is positioned below 40% or above 60% of a height of the first conductive feature.

Abstract: A test method for a basic input/output system (BIOS), configured to test a computer device which includes the BIOS when a power on self test (POST) of the BIOS fails, is disclosed including following operations: enabling a fixing function of the BIOS by a debug port of a motherboard of the computer device; enabling a first memory device and disabling a second memory device, by the debug port; according to the fixing function, turning on the computer device by the first memory device; and determining whether the computer device is turned on successfully.

Abstract: A method includes forming metal lines over an interconnect structure that is formed above transistors; depositing a liner layer over the metal lines using a first high density plasma chemical vapor deposition (HDPCVD) process with a zero RF bias power depositing a first passivation layer over the liner layer using a second HDPCVD process with a non-zero RF bias power; and depositing a second passivation layer in contact with a top surface of the first passivation layer using a third HDPCVD process with a non-zero RF bias power.

Abstract: A method includes forming metal lines over an interconnect structure that is formed above transistors; depositing a liner layer over the metal lines using a first high density plasma chemical vapor deposition (HDPCVD) process with a zero RF bias power depositing a first passivation layer over the liner layer using a second HDPCVD process with a non-zero RF bias power; and depositing a second passivation layer in contact with a top surface of the first passivation layer using a third HDPCVD process with a non-zero RF bias power.

Abstract: A low-noise lifting device includes a rack and a gear. The rack includes first teeth each having a first crown portion. A surface of the first crown portion is defined as a first contact surface having a circular arc shape. The gear includes second teeth. A second root portion is defined between every adjacent two of the second teeth. A surface of the second root portion is defined as a second contact surface having a circular arc shape. When the gear is meshed with the rack, the second contact surface and the first contact surface are in close contact with each other in a circular arc shape, without a backlash, so as to reduce the noise generated by the transmission.

Abstract: Described herein are compositions a genetically modified comprising nucleic acids encoding a chimeric antigen receptor (CAR) and a checkpoint inhibitor and methods for using the compositions to treat cancer.

Abstract: The present invention provides a light source module. The first light source forms the first beam from the second light source, the third light source, and the function of the first beam splitter. Then the second beam splitter reflects the first beam and transmits the fourth beam from the fourth light source for forming the mixed beam, which is received and projected by the optical processing device. Thereby, by using the high color rendering and special optical properties of the mixed beam, the applications and efficacy of the present invention can be improved.

Abstract: A test method for a basic input/output system (BIOS), configured to test a computer device which includes the BIOS when a power on self test (POST) of the BIOS fails, is disclosed including following operations: enabling a fixing function of the BIOS by a debug port of a motherboard of the computer device; enabling a first memory device and disabling a second memory device, by the debug port; according to the fixing function, turning on the computer device by the first memory device; and determining whether the computer device is turned on successfully.

Abstract: The present disclosure provides a rear structure coupled to a display panel. The rear structure comprises a rear cover comprising a rib structure for supporting the display panel, the rib structure comprising a plurality of horizontal bars, a plurality of vertical bars, and a plurality of blocks, and each of the blocks formed by at least one of the horizontal bars and at least one of the vertical bars. Wherein a first section of the rib structure comprises at least two aligned adjacent horizontal bars and at least two aligned adjacent vertical bars, and a second section of the rib structure comprises at least two non-aligned vertical bars.

Abstract: The invention is directed to a masked chimeric antigen receptor, comprising: (a) a masking peptide; (b) one or more antigen-specific targeting domains; (c) an extracellular spacer domain; (d) a transmembrane domain; (e) at least one co-stimulatory domain; and (f) an intracellular signaling domain. The mCARs are activated upon cleavage of the masking peptide.

Abstract: A test method for testing a built-in memory in a computer device includes the following operations. The built-in memory is tested by a test function of a basic input/output system (BIOS) in the computer device to create a data file. An analysis application is performed by a test device to analyze the data file. According to analyzing the data file, an abnormal memory chip is determined whether to exist in the built-in memory. The data file includes test data of memory chips in the built-in memory.

Abstract: A conductive substrate of a display device has an electrically insulating substrate and a plurality of rows of electrical pin connecting areas, a plurality of rows of patterned input voltage lines and a plurality of rows of patterned grounded lines formed on the electrically insulated substrate. Each of the rows of the electrical pin connecting areas includes a plurality of electrical pin connecting areas electrically isolated and spaced from each other in a line. The rows of the patterned input voltage lines are respectively adjacent to the rows of the electrical pin connecting areas, and the rows of the patterned grounded lines are respectively adjacent to the rows of the electrical pin connecting areas.

Abstract: An iterative detection and decoding (IDD) circuit is provided. The iterative detection and decoding (IDD) circuit is configured to perform M outer iterations on a received signal, and Ni inner iterations are performed during the ith outer iteration of the M outer iterations, where M is an integer greater than 1, i is an integer less than or equal to M, and N1 to NM are integers and include at least two different values.

Abstract: The present disclosure provides a rear structure coupled to a display panel. The rear structure comprises a wall mount assembly comprising a first kit comprising a first wall mount bracket, a plurality of circularly arranged first trenches, and a plurality of first magnets accommodated by the first trenches, and a second kit removably coupled to the first kit comprising a second wall mount bracket structurally complementary to the first wall mount bracket, a plurality of circularly arranged second trenches, and a plurality of second magnets accommodated by the second trenches. Wherein when the first kit is coupled to the second kit, each of the first magnets is located corresponds to one of the second magnets, and a magnetism of a side of one of the first magnets facing the second kit is opposite to a magnetism of a side of one of the second magnets facing the first kit.