Abstract: A school admission prediction system and method are provided. The system includes a user interface for receiving personal data from an applicant, including academic and activity data. A data acquisition module connected to the user interface acquires this personal data. A data preprocessing module connected to the data acquisition module preprocesses the academic and activity data. An attribute selection module connected to the data preprocessing module extracts multiple attributes from the preprocessed data. A machine learning model generates an evaluation report based on the extracted attributes. This report includes a prediction of whether the applicant will be admitted to the school. The system also includes a loss calculation module for evaluating the performance of the machine learning model and optimizing its parameters based on the evaluation results. The method and system provide a reliable and efficient way to predict school admissions, helping applicants to better prepare their applications.

Abstract: A broadband linear polarization antenna structure, including a reference conductive layer, a first patch antenna, a second patch antenna, and a feeding portion, is provided. The reference conductive layer includes through holes. A first short pin is connected between the reference conductive layer and the first patch antenna, and a second short pin is connected between the first patch antenna and the second patch antenna. Each feeding portion penetrates the reference conductive layer through the through hole and is coupled to the first patch antenna.

Abstract: A method for analyzing electromagnetic characteristic includes steps as follows. An electromagnetic evaluation model establishing step is performed, which includes establishing an object unit, a power transmitting unit, and a simulating unit. The object unit is an arbitrary geometry shape. The power transmitting unit has an electromagnetic signal. The simulating unit is defined as at least one base point emitting a plurality of beams to form a plurality of projection points. An electromagnetic reference model is provided, wherein the object unit and the power transmitting unit are combined to form the electromagnetic reference model. A comparing step is performed, wherein a radiation pattern data of the electromagnetic reference model and a radiation pattern data of the electromagnetic evaluation model are obtained by the electromagnetic signal, respectively, and the two radiation pattern data are compared to obtain an electromagnetic gain difference value.

Abstract: A broadband linear polarization antenna structure, including a reference conductive layer, a first patch antenna, a second patch antenna, and a feeding portion, is provided. The reference conductive layer includes through holes. A first short pin is connected between the reference conductive layer and the first patch antenna, and a second short pin is connected between the first patch antenna and the second patch antenna. Each feeding portion penetrates the reference conductive layer through the through hole and is coupled to the first patch antenna.

Abstract: A method for analyzing electromagnetic characteristic includes steps as follows. An electromagnetic evaluation model establishing step is performed, which includes establishing an object unit, a power transmitting unit, and a simulating unit. The object unit is an arbitrary geometry shape. The power transmitting unit has an electromagnetic signal. The simulating unit is defined as at least one base point emitting a plurality of beams to form a plurality of projection points. An electromagnetic reference model is provided, wherein the object unit and the power transmitting unit are combined to form the electromagnetic reference model. A comparing step is performed, wherein a radiation pattern data of the electromagnetic reference model and a radiation pattern data of the electromagnetic evaluation model are obtained by the electromagnetic signal, respectively, and the two radiation pattern data are compared to obtain an electromagnetic gain difference value.

Abstract: A transition device includes a first metal layer, a signaling metal line, an excitation metal piece, a first dielectric layer, a plurality of conductive via elements, a reflector, and a waveguide. The first metal layer has a notch. The notch extends to the interior of the first metal layer, forming a first slot region. The signaling metal line is disposed in the notch. The excitation metal piece is disposed in the first slot region and is coupled to the signaling metal line. The first dielectric layer has a pair of first openings. The first dielectric layer includes a bridging portion disposed between the first openings. The bridging portion is configured to carry the excitation metal piece. The conductive via elements penetrate the first dielectric layer and are coupled to the first metal layer. The conductive via elements at least partially surround the first slot region.

Abstract: An antenna structure includes a radiation metal element, a first feeding metal element, a second feeding metal element, a metal loop, a ground metal element, a first dielectric layer, a second dielectric layer, and a via metal element. The radiation metal element has a first slot, a second slot, a third slot, and a fourth slot, which surround a first opening, a second opening, a third opening, and a fourth opening. The first feeding metal element extends into the first opening. The second feeding metal element extends into the second opening. The first dielectric layer is disposed between the radiation metal element and the metal loop. The second dielectric layer is disposed between the metal loop and the ground metal element. The via metal element couples a first connection point on the radiation metal element to a second connection point on the ground metal element.

Abstract: An antenna structure includes a dielectric substrate, a ground plane, and a main radiation element. The main radiation element and the ground plane are disposed on two opposite surfaces of the dielectric substrate. The main radiation element has a first loop-shaped slot and a second loop-shaped slot. The first loop-shaped slot is inside the second loop-shaped slot. The first loop-shaped slot includes a first slot, a second slot, a third slot, a fourth slot, a pair of first partition slots, a pair of second partition slots, a pair of third partition slots, and a pair of fourth partition slots. The first slot, the second slot, the third slot, and the fourth slot are interleaved with the first partition slots, the second partition slots, the third partition slots, and the fourth partition slots.

Abstract: An antenna structure includes a radiation metal element, a first feeding metal element, a second feeding metal element, a metal loop, a ground metal element, a first dielectric layer, a second dielectric layer, and a via metal element. The radiation metal element has a first slot, a second slot, a third slot, and a fourth slot, which surround a first opening, a second opening, a third opening, and a fourth opening. The first feeding metal element extends into the first opening. The second feeding metal element extends into the second opening. The first dielectric layer is disposed between the radiation metal element and the metal loop. The second dielectric layer is disposed between the metal loop and the ground metal element. The via metal element couples a first connection point on the radiation metal element to a second connection point on the ground metal element.

Abstract: An antenna structure includes a first conductive layer, a second conductive layer, a bent conductive layer, and a first coaxial cable. The second conductive layer has a first opening. A cavity is formed between the first conductive layer and the second conductive layer. The bent conductive layer is coupled between the first conductive layer and the second conductive layer. The bent conductive layer is configured to divide the cavity into a first portion and a second portion. The first coaxial cable includes a first central conductive line and a first conductive shielding. The first central conductive line extending through the first opening is coupled to a first feeding point on the first conductive layer. The first conductive shielding is coupled to the second conductive layer.

Abstract: A transition device includes a first metal layer, a signaling metal line, an excitation metal piece, a first dielectric layer, a plurality of conductive via elements, a reflector, and a waveguide. The first metal layer has a notch. The notch extends to the interior of the first metal layer, forming a first slot region. The signaling metal line is disposed in the notch. The excitation metal piece is disposed in the first slot region and is coupled to the signaling metal line. The first dielectric layer has a pair of first openings. The first dielectric layer includes a bridging portion disposed between the first openings. The bridging portion is configured to carry the excitation metal piece. The conductive via elements penetrate the first dielectric layer and are coupled to the first metal layer. The conductive via elements at least partially surround the first slot region.

Abstract: An antenna structure includes a dielectric substrate, a ground plane, and a main radiation element. The main radiation element and the ground plane are disposed on two opposite surfaces of the dielectric substrate. The main radiation element has a first loop-shaped slot and a second loop-shaped slot. The first loop-shaped slot is inside the second loop-shaped slot. The first loop-shaped slot includes a first slot, a second slot, a third slot, a fourth slot, a pair of first partition slots, a pair of second partition slots, a pair of third partition slots, and a pair of fourth partition slots. The first slot, the second slot, the third slot, and the fourth slot are interleaved with the first partition slots, the second partition slots, the third partition slots, and the fourth partition slots.

Abstract: An antenna structure includes a first conductive layer, a second conductive layer, a bent conductive layer, and a first coaxial cable. The second conductive layer has a first opening. A cavity is formed between the first conductive layer and the second conductive layer. The bent conductive layer is coupled between the first conductive layer and the second conductive layer. The bent conductive layer is configured to divide the cavity into a first portion and a second portion. The first coaxial cable includes a first central conductive line and a first conductive shielding. The first central conductive line extending through the first opening is coupled to a first feeding point on the first conductive layer. The first conductive shielding is coupled to the second conductive layer.

Abstract: A testing device is provided for testing a display panel including a first circuit board. The testing device includes a second circuit board and a pressing element. The second circuit board includes a main body, multiple test pads, multiple testing circuits and multiple conducting elements. The test pads are arranged on a first surface of the main body and corresponding to respective pins of the first circuit board. The testing circuits are formed on the second surface of the main body and corresponding to respective test pads. The first circuit board is stacked on the second circuit board. The testing circuits are electrically with respective pins through respective conducting elements and respective test pads. The pressing element presses a stacking region between the first circuit board and the second circuit board, thereby facilitating close contact between the first circuit board and the second circuit board.

Abstract: An ion source apparatus has an ion source assembly and a neutralizer. The ion source assembly has a body, a heat-dissipating device, an anode chunk and a gas distributor. The heat-dissipating device has a thermal transfer plate and a first thermal side sheet. The thermal transfer plate has a top, a protrusion and an annular disrupting recess. The protrusion is formed at the top of the thermal transfer plate. The disrupting recess is radially formed around the protrusion. The first thermal side sheet surrounds the protrusion. The gas distributor is mounted securely in the protrusion. Because the protrusion is located between the gas distributor and the first thermal side sheet and the disrupting recess is radially formed around the protrusion, accumulated ions, molecules and deposition film particles are longitudinally disrupted and do not form a short circuit between the gas distributor and the first thermal side sheet.

Abstract: An ion source apparatus has an ion source assembly and a neutralizer. The ion source assembly has a body, a heat-dissipating device, an anode chunk and a gas distributor. The heat-dissipating device has a thermal transfer plate and a first thermal side sheet. The thermal transfer plate has a top, a protrusion and an annular disrupting recess. The protrusion is formed at the top of the thermal transfer plate. The disrupting recess is radially formed around the protrusion. The first thermal side sheet surrounds the protrusion. The gas distributor is mounted securely in the protrusion. Because the protrusion is located between the gas distributor and the first thermal side sheet and the disrupting recess is radially formed around the protrusion, accumulated ions, molecules and deposition film particles are longitudinally disrupted and do not form a short circuit between the gas distributor and the first thermal side sheet.

Abstract: A testing device is provided for testing a display panel including a first circuit board. The testing device includes a second circuit board and a pressing element. The second circuit board includes a main body, multiple test pads, multiple testing circuits and multiple conducting elements. The test pads are arranged on a first surface of the main body and corresponding to respective pins of the first circuit board. The testing circuits are formed on the second surface of the main body and corresponding to respective test pads. The first circuit board is stacked on the second circuit board. The testing circuits are electrically with respective pins through respective conducting elements and respective test pads. The pressing element presses a stacking region between the first circuit board and the second circuit board, thereby facilitating close contact between the first circuit board and the second circuit board.