Abstract: A method for testing an integrated circuit implemented in an electronic system. The method includes placing an integrated circuit (or portion thereof) that is implemented in an operational system (e.g., in a computer system) in an offline status. An electrical parameter of the integrated system (e.g., a voltage, clock frequency, etc.) is set, and a built-in self-test (BIST) is conducted. Any failures that occur during the BIST are recorded. Testing is then repeated for each of a plurality of predetermined values of the electrical parameter, recording any failures that occur. Once testing is complete a failure rate/range is determined for each of the predetermined values.

Abstract: An apparatus for an event tolerant circuit including a latch. The event tolerant circuit may maintain correct data values even after the occurrence of an event such as a soft error. The event tolerant circuit may introduce a delay in a feedback loop, thereby passing the glitch value to an element in the feedback loop at different times, thus preventing the propagation of the glitch through the event tolerant circuit.

Abstract: An apparatus for an event tolerant circuit including a latch. The event tolerant circuit may maintain correct data values even after the occurrence of an event such as a soft error. The event tolerant circuit may introduce a delay in a feedback loop, thereby passing the glitch value to an element in the feedback loop at different times, thus preventing the propagation of the glitch through the event tolerant circuit.

Abstract: A method for testing an integrated circuit implemented in an electronic system. The method includes placing an integrated circuit (or portion thereof) that is implemented in an operational system (e.g., in a computer system) in an offline status. An electrical parameter of the integrated system (e.g., a voltage, clock frequency, etc.) is set, and a built-in self-test (BIST) is conducted. Any failures that occur during the BIST are recorded. Testing is then repeated for each of a plurality of predetermined values of the electrical parameter, recording any failures that occur. Once testing is complete a failure rate/range is determined for each of the predetermined values.

Abstract: A detector digitally monitors and detects when an oscillating signal output by a phase-locked-loop (PLL) is locked to a reference signal input to the PLL. The PLL includes a phase frequency detector that outputs an up signal and a down signal that each has a pulse width. When the oscillating signal is locked to the reference signal, the pulse widths of the up and down signals are equal. The detector detects when the pulse widths are unequal, and outputs a lock status signal that indicates this condition.