Patents by Inventor Anand Shankar Bhide

Anand Shankar Bhide has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9552379
    Abstract: Systems and methods for foreign key identification are described. The method includes computing a threshold value for each of a primary key-foreign key (PK-FK) pair of a super-set of PK-FK, and generating a sub-set of PK-FK pairs based on comparison of the threshold value and a predefined threshold value. The predefined threshold value is indicative of an acceptance criterion. Further, the method includes determining a conformance score for each of the PK-FK pair of the subset of PK-FK pairs. The conformance score is based on deviations between Cumulative Probability Distribution (CPD) values of PK and CPD of FK for each PK-FK pair. Further, the method includes comparing the conformance score of the each PK-FK pair of the sub-set of PK-FK pairs with a predetermined acceptability index. The predetermined acceptability index is indicative of an acceptance of at least one positive FK from the set of PK-FK pairs.
    Type: Grant
    Filed: March 15, 2013
    Date of Patent: January 24, 2017
    Assignee: Tata Consultancy Services Limited
    Inventors: Karandas Pejathaya, Gopinath Talluri, Anand Shankar Bhide
  • Patent number: 9152662
    Abstract: The present subject matter relates to systems and methods for determining quality of data. In one implementation, the method comprises identifying at least one column of the data repository based on an importance index associated with the at least one column, wherein the importance index is indicative of the criticality of the data stored in the at least one column; and retrieving at least one data quality analysis rule associated with the at least one column. The method further comprises assigning a rule weightage parameter to each of the at least one data quality analysis rule and a column weightage parameter to each of the identified columns and analyzing the data stored in the identified columns based on the at least one data quality analysis rule. Based in part on the analysis a data quality score, indicative of the quality of data stored in the data repository is computed.
    Type: Grant
    Filed: January 15, 2013
    Date of Patent: October 6, 2015
    Assignee: TATA CONSULTANCY SERVICES LIMITED
    Inventors: Anand Shankar Bhide, Gopinath Talluri
  • Publication number: 20140089255
    Abstract: Systems and methods for foreign key identification are described. In one embodiment, the method includes computing a threshold value for each of a primary key-foreign key (PK-FK) pair of a super-set of PK-FK, and generating a sub-set of PK-FK pair based on comparison of the threshold value and a predefined threshold value, where the predefined threshold value is indicative of an acceptance criterion. Further, the method includes determining a conformance score for each of the PK-FK pair of the subset of PK-FK pair, wherein the conformance score is based on deviations between Cumulative Probability Distribution (CPD) values of PK and CPD of FK for each PK-FK pair. Further comparing the conformance score of the each PK-FK pair of the sub-set of PK-FK pairs with a predetermined acceptability index, where the predetermined acceptability index is indicative of an acceptance of at least one positive FK from the set of PK-FK pairs.
    Type: Application
    Filed: March 15, 2013
    Publication date: March 27, 2014
    Applicant: Tata Consultancy Services Limited
    Inventors: Karandas Pejathaya, Gopinath Talluri, Anand Shankar Bhide