Abstract: A flanged half-bearing includes at least one substantially semi-annular thrust washer with an internal periphery having lateral lugs and an intermediary stabilization lug projecting from the internal periphery of the thrust washer, and a semi-cylindrical half journal bearing shell having lateral recesses and an intermediary stabilization recess that are recessed into an axial end face of the bearing shell and are respectively connected to the lateral lugs and the stabilization lug of the thrust washer, wherein the stabilization lug has rotational stabilization edges that project substantially perpendicularly from the inner periphery of the thrust washer, and the stabilization recess is configured for axial relative movement of stabilization lug. An engine includes at least one such flanged half-bearing.

Abstract: In a gas turbine installation having an enclosure for passing cooling air therethrough and around the gas turbine, provision is made for a mixing of the cooling air with the exhaust gases being emitted from the gas turbine to thereby reduce the temperature thereof prior to its passing into the exhaust stack, but only after the primary air has passed through a catalyst bed which is disposed in a position over the gas turbine exhaust opening. The shape of the catalyst bed is preferably A-shaped in cross-section to thereby increase the surface area thereof. In this way, the temperature at the catalyst bed is maintained at an elevated level to obtain superior performance while a subsequent mixing of the primary air with the cooling air results in lower temperatures of the gases passing through the exhaust stack.

Abstract: A digital signature built-in-test (BIT) device for testing a digital circuit includes circuitry for compressing test data received from the digital circuit. The test data compressing circuitry may include one or more linear feedback shift registers (LFSR), which compresses the test data and supplies a signature data word corresponding to the test data compressed. Circuitry for enabling the test data compressing circuitry for a predetermined period of time is also included. The enabling circuitry provides an enabling signal to the test data compressing circuitry. The signature data word from the test data compressing circuitry is stored in a buffer memory circuit. Control data is received by the digital signature BIT device from a remote processor. The control data is received and processed by a control circuit, which circuit supplies control signals to the test data compressing circuitry, signature data word storing circuitry and the enabling circuitry.