Patents by Inventor Anatasia Oshelski

Anatasia Oshelski has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Statistical process control system with normalized control charting
    Patent number: 6424876
    Abstract: A method for monitoring the performance of a manufacturing entity is provided. Metrology data indicating an output parameter of the manufacturing entity is retrieved. The output parameter has an associated target value. The metrology data is normalized based on the target value to generate normalized performance data points. A performance rule violation is determined based on the normalized performance data. A manufacturing system includes a metrology tool, a first database, and a processor. The metrology tool is adapted to measure an output parameter of a manufacturing entity to generate metrology data. The output parameter has an associated target value. The first database is adapted to receive the metrology data. The processor is adapted to retrieve the metrology data from the database, normalize the metrology data based on the target value to generate normalized performance data points, and determine a performance rule violation based on the normalized performance data.
    Type: Grant
    Filed: July 22, 1999
    Date of Patent: July 23, 2002
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Brian K. Cusson, James Sharier, Justin Giguere, Anatasia Oshelski