Abstract: An apparatus for measuring the Q-quality of oscillatory circuit components includes a control unit electrically coupled to a high-frequency generator connected to a frequency modulator having its output connected to a measuring unit. The measuring unit is electrically coupled to the oscillatory circuit components whose Q-quality is to be measured. The apparatus includes a unit for producing the first frequency derivative of the amplitude-frequency response of the oscillatory circuit, said unit being connected to a third control unit, and a unit for producing the second frequency derivative of the amplitude-frequency response of the oscillatory circuit, said unit being also connected to said third control unit. The third control unit is connected to a peak detector, to an electronic switch, to a first and second memory units, and to the drive input of the frequency modulator.