Abstract: A method for calibrating thermal analysis device includes: photothermal measurements on a sample consecutively held in the plurality of sample holders, or on a plurality of similar samples, which are in each case held in one of the plurality of sample holders, wherein a first side of the respective sample is irradiated with an electromagnetic excitation pulse and a thermal radiation emitted by a second side of this sample is captured; comparing results of the photothermal measurements for the plurality of sample holders; in each case determining at least one correction parameter for each sample holder based on a result of the comparison; and calibrating the temperature measuring system of the device and/or the temperature control systems of the device based on the determined correction parameters.

Abstract: A method and a device for the thermal analysis of a sample, as well as a method and a device for the calibration of a temperature measuring device used in a device for the thermal analysis.

Abstract: A system for measuring the thermal diffusivity of a material includes a housing having an upper portion and a lower portion, a plate holding the material in a fixed position between the upper portion and lower portion of the housing, and a source at the lower portion of the housing projecting heat onto the material along a first axis that is perpendicular to the plate. A sensor at the lower portion of the housing is movable in relation to the plate and senses the heat radiating through the material along a second axis that is perpendicular to the plate and offset from the first axis. A controller receives data from the sensor and calculates the thermal diffusivity of the material.

Abstract: A method for calibrating thermal analysis device includes: photothermal measurements on a sample consecutively held in the plurality of sample holders, or on a plurality of similar samples, which are in each case held in one of the plurality of sample holders, wherein a first side of the respective sample is irradiated with an electromagnetic excitation pulse and a thermal radiation emitted by a second side of this sample is captured; comparing results of the photothermal measurements for the plurality of sample holders; in each case determining at least one correction parameter for each sample holder based on a result of the comparison; and calibrating the temperature measuring system of the device and/or the temperature control systems of the device based on the determined correction parameters.

Abstract: A method and a device for the thermal analysis of a sample, as well as a method and a device for the calibration of a temperature measuring device used in a device for the thermal analysis.

Abstract: A system for measuring the thermal diffusivity of a material includes a housing having an upper portion and a lower portion, a plate holding the material in a fixed position between the upper portion and lower portion of the housing, and a source at the lower portion of the housing projecting heat onto the material along a first axis that is perpendicular to the plate. A sensor at the lower portion of the housing is movable in relation to the plate and senses the heat radiating through the material along a second axis that is perpendicular to the plate and offset from the first axis. A controller receives data from the sensor and calculates the thermal diffusivity of the material.

Abstract: A device for the photothermic investigation of a sample, with an excitation source for generating an electromagnetic excitation beam directed onto an excitation side of the sample, a detector for detecting thermal radiation emitted by a detection side of the sample, and a temperature-controllable sample chamber with a sample holder accommodated therein for the arrangement and temperature control of the sample. According to the invention, provision is made such that an adjustable detection lens system is provided between the sample holder and the detector, the detection lens system being adjustable in order to adjust a desired field of vision of the detector on the sample surface.