Patents by Inventor Andrea MUELTER

Andrea MUELTER has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10365466
    Abstract: A method for microscopically imaging a volume sample includes focusing a microscope objective having a correcting element successively in at least two reference planes which are located within the volume sample at different volume sample depths along the optical axis of the microscope objective; determining, for each reference plane, a reference setting of the correcting element in which an imaging error which is dependent upon the volume sample depth is corrected by the correcting element; determining, on the basis of the reference settings determined for at least one target plane in the volume sample, a target setting for the correcting element in which the imaging error occurring at the volume sample depth of the target plane is corrected by the correcting element; and focusing the microscope objective on the target plane and bringing the correcting element into the target setting in order to image the volume sample.
    Type: Grant
    Filed: February 9, 2015
    Date of Patent: July 30, 2019
    Assignee: LEICA MICROSYSTEMS CMS GMBH
    Inventors: Christian Schumann, Andrea Muelter
  • Publication number: 20170168280
    Abstract: A method for microscopically imaging a volume sample includes focusing a microscope objective having a correcting element successively in at least two reference planes which are located within the volume sample at different volume sample depths along the optical axis of the microscope objective; determining, for each reference plane, a reference setting of the correcting element in which an imaging error which is dependent upon the volume sample depth is corrected by the correcting element; determining, on the basis of the reference settings determined for at least one target plane in the volume sample, a target setting for the correcting element in which the imaging error occurring at the volume sample depth of the target plane is corrected by the correcting element; and focusing the microscope objective on the target plane and bringing the correcting element into the target setting in order to image the volume sample.
    Type: Application
    Filed: February 9, 2015
    Publication date: June 15, 2017
    Applicant: LEICA MICROSYSTEMS CMS GMBH
    Inventors: Christian SCHUMANN, Andrea MUELTER