Abstract: A measurement system configured to determine an apparatus parameter related to a working procedure of an apparatus involving movements. The system includes a measurement unit including a sensor member configured to measure accelerations and generate a sensor signal in dependence thereto, and to apply the signal(s) to a processing unit. The measurement unit is configured to be arranged at the apparatus such that the measurement unit, during a measurement procedure, is repetitively moved in a loop, displaying a loop trajectory, in both forward and backward directions along the loop trajectory, and to perform measurements of accelerations during the measurement procedure. The processing unit is configured to determine an apparatus parameter of working procedure movements which are indicated in the measured accelerations, and only based upon the measured accelerations, and configured to calculate a measure of the apparatus parameter only based upon one or many parameters of the accelerations.

Abstract: A measurement system configured to determine an apparatus parameter related to a working procedure of an apparatus involving movements. The system includes a measurement unit including a sensor member configured to measure accelerations and generate a sensor signal in dependence thereto, and to apply the signal(s) to a processing unit. The measurement unit is configured to be arranged at the apparatus such that the measurement unit, during a measurement procedure, is repetitively moved in a loop, displaying a loop trajectory, in both forward and backward directions along the loop trajectory, and to perform measurements of accelerations during the measurement procedure. The processing unit is configured to determine an apparatus parameter of working procedure movements which are indicated in the measured accelerations, and only based upon the measured accelerations, and configured to calculate a measure of the apparatus parameter only based upon one or many parameters of the accelerations.

Abstract: The invention pertains to a method for determining machine parameters of a mechanical device in which a first element and a second element are mutually movable in settable patterns of movement, the method comprising placing a measuring arm between the first and second elements, displacing the first and second elements mutually in a predetermined intended movement path, applying a predetermined force between the first element and the second element substantially in the longitudinal direction of the measuring arm, recording the resulting actual movement path by means of the measuring arm, thereby determining a difference between the intended movement path and the actual movement path, and deriving, based on the determined difference, machine parameters indicating a condition of the mechanical device, characterized in that the predetermined force comprises a dynamically varying portion. The invention furthermore pertains to a test assembly for performing said method.

Abstract: The invention pertains to a method for determining machine parameters of a mechanical device in which a first element and a second element are mutually movable in settable patterns of movement, the method comprising placing a measuring arm between the first and second elements, displacing the first and second elements mutually in a predetermined intended movement path, applying a predetermined force between the first element and the second element substantially in the longitudinal direction of the measuring arm, recording the resulting actual movement path by means of the measuring arm, thereby determining a difference between the intended movement path and the actual movement path, and deriving, based on the determined difference, machine parameters indicating a condition of the mechanical device, characterized in that the predetermined force comprises a dynamically varying portion. The invention furthermore pertains to a test assembly for performing said method.