Abstract: A multi-fibre optical probe for spectroscopically analysing high concentration mediums (i.e. about 40 wt % or higher solid particulates), an extruder comprising a multi-fibre optical probe, use of said multi-fibre optical probe are provided. Methods of generating a predictive model, determining the value of a parameter of a solid particulate dispersion and manufacturing a solid particulate dispersion are also provided.

Abstract: Methods of testing pharmaceutical compositions for the presence or absence of active pharmaceutical ingredient (API) crystallinity in an amorphous solid dispersion or solid-state solution using UV/vis spectrometry is provided. Testing may be performed standalone or during manufacturing of a pharmaceutical composition. A predictive model provides for quantitative analysis of the amount of crystalline API based on UV/vis data of corresponding reference samples. Also provided is an apparatus for manufacturing a pharmaceutical composition.

Abstract: A method of improving the precision and speed of probe microscopy. Direct geometric measurement of relevant date points allows more rapid determination of critical dimensions while improving measurement precision through minimized system drift. Precision and throughput is further improved by deflection-based measurement. Sensitivity to soft contacts is improved by using diagonal approach trajectories for the probe tip (20). And throughput is improved while risk of damage to tip and/or surface is reduced by using lateral force detection.

Abstract: A probe having a probe tip, especially for use in an atomic force microscope, formed by micromachining techniques in a silicon wafer. The tip is photolithographically defined in a layer, preferably of silicon nitride deposited on the silicon wafer, and has a width and thickness of usually less than 250 nm. Thereby, the probe tip can be formed to have a generally square cross section in which one lateral dimension is determined by the layer thickness, and the other lateral dimension by the photolithography or by a subsequent step of focused ion beam milling. The portion of the silicon wafer underlying the area probe tip is etched away, preferably before the probe tip is etched, but another portion of the silicon is left to serve as a support at the base of the probe tip. A hinge may be formed in the silicon wafer, and the probe tip together with a robust shank can be made to rotate to a direction perpendicular to the wafer surface.

Abstract: A probe tip manufactured from a conically shaped quartz tip etched to a fine apex. The quartz tip is coated with about 1 &mgr;m of a hard material such as silicon nitride. A probe tip having dimensions of about 100 nm×1 &mgr;m is then machined from the hard material adjacent to the apex of the quartz tip along the axis of the quartz tip. The machining is preferably performed by focused ion beam milling.

Abstract: A method and apparatus associated with an atomic force microscope (AFM) to more accurately measure the height of a microscopic feature in a substrate, particularly one having a sloping face. The probe tip is sequentially positioned at a number of vertical positions approaching the surface being probed. At each vertical position, a vertical force encountered by the probe tip is measured, and the measured force is stored in a memory together with its corresponding vertical position. When the measured force exceeds a threshold force, the downward movement is stopped, and the accumulated force and position data are analyzed. A controller fits the data to two curves, for example, two linear relationships in force vs. height. One curve is associated with the lower forces away from the surface, the other curve with the higher forces after initial engagement with the surface. The intersection of the two curves gives the height of the feature in the surface.